Results 61 to 70 of about 91 (76)
Some of the next articles are maybe not open access.
Online BIST and BIST-based diagnosis of FPGA logic blocks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2004M Abramovici
exaly
On improving test quality of scan-based BIST
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2000Kwang-Ting Cheng, S Bhawmik
exaly
A Flexible Programmable Memory BIST Architecture
IETE Journal of Education Online, 2010Philemon Daniel, Rajeevan Chandel
exaly
Symmetry Measure for Memory Test and Its Application in BIST Optimization
Journal of Electronic Testing: Theory and Applications (JETTA), 2011Gurgen Harutyunyan, Yervant Zorian
exaly
A Low-Cost Concurrent BIST Scheme for Increased Dependability
IEEE Transactions on Professional Communication, 2005I Voyiatzis, C Halatsis
exaly
A BIST TPG for Low Power Dissipation and High Fault Coverage
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2007Seongmoon Wang
exaly