Results 71 to 80 of about 414 (87)
Some of the next articles are maybe not open access.

Built-In Self-Test (BIST) Methods for MEMS: A Review

Micromachines, 2021
Gergely Hantos   +2 more
exaly  

BİST-500’de İşlem Gören Sigorta Şirketlerinin TOPSIS, VIKOR ve MOORA Yöntemleri ile Karşılaştırmalı Finansal Performans Analizi

Çalışmada, BİST-500 sigorta endeksinde işlem gören 8 sigorta şirketinin 2013-2022 dönemlerine ait finansal verileri TOPSIS, VIKOR ve MOORA yöntemleri ile 18 kriterle analiz edilmiştir. Çalışma ile sigorta sektörü şirketlerinin finansal durumunu ortaya koyarak karar vericiler ve yatırımcılar için yol gösterici olması amaçlanmıştır.
Kartal, Cem, Özdil, Zafer
openaire   +1 more source

Theory of transparent BIST for RAMs

IEEE Transactions on Computers, 1996
M Nicolaidis
exaly  

BIST for systems-on-a-chip

The Integration VLSI Journal, 1998
Hans-Joachim Wunderlich
exaly  

On improving test quality of scan-based BIST

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2000
Kwang-Ting Cheng
exaly  

A Flexible Programmable Memory BIST Architecture

IETE Journal of Education Online, 2010
Rajeevan Chandel
exaly  

Symmetry Measure for Memory Test and Its Application in BIST Optimization

Journal of Electronic Testing: Theory and Applications (JETTA), 2011
Gurgen Harutyunyan
exaly  

A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2016
Mukesh Agrawal, Krishnendu Chakrabarty
exaly  

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