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Theoretical Bounds in Decentralized Hypothesis Testing

IEEE Transactions on Signal Processing
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A lower bound for testing juntas

Information Processing Letters, 2004
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Hana Chockler, Dan Gutfreund
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Bounds on pseudoexhaustive test lengths

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1998
Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (cone-dependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested.
Rajagopalan Srinivasan, Sandeep K. Gupta 0001, Melvin A. Breuer   +2 more
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Testing for Bounded Faults in RAMs

Journal of Electronic Testing, 1997
We study the class of “bounded faults” in random-access memories; these are faults that involve a bounded number of cells. This is a very general class of memory faults that includes, for example, the usual stuck-at, coupling, and pattern-sensitive faults, but also many other types of faults. Some bounded faults are known to require deterministic tests
René David, Janusz A. Brzozowski, Helmut Jürgensen   +2 more
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Testing Outerplanarity of Bounded Degree Graphs

Algorithmica, 2010
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Yuichi Yoshida, Hiro Ito
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Property Testing in Bounded Degree Graphs

Algorithmica, 1997
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Oded Goldreich 0001, Dana Ron
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A lower bound for testing 3-colorability in bounded-degree graphs

The 43rd Annual IEEE Symposium on Foundations of Computer Science, 2002. Proceedings., 2003
We consider the problem of testing 3-colorability in the bounded-degree model. We show that, for small enough /spl epsiv/, every tester for 3-colorability must have query complexity /spl Omega/(n). This is the first linear lower bound for testing a natural graph property in the bounded-degree model.
Andrej Bogdanov, Kenji Obata, Luca Trevisan 0001   +2 more
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An upper bound on software testing effectiveness

ACM Transactions on Software Engineering and Methodology, 2008
Failure patterns describe typical ways in which inputs revealing program failure are distributed across the input domain—in many cases, clustered together in contiguous regions. Based on these observations several debug testing methods have been developed.
Tsong Yueh Chen, Robert G. Merkel
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Self-test scheduling with bounded test execution time

Proceedings International Test Conference 1992, 1992
Complex VLSI circuits with built-in self-test resources are segmented into a number of subcircuits, that to some extent can be tested concurrently. For each subcircuit a signature is collected. The test schedule has to organize the test execution such that the available resources are optimally utilized.
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