Results 21 to 30 of about 28,292 (242)

Evaluation of TlBr semiconductor detector in gamma camera imaging: Monte Carlo simulation study

open access: yesNuclear Engineering and Technology, 2022
Among the detector materials available at room temperature, thallium bromide (TlBr), which has a relatively high atomic number and density, is widely used for gamma camera imaging.
Youngjin Lee, Chanrok Park
doaj   +1 more source

Composite Thermoelectric Materials Based on Lead Telluride and Cadmium Telluride

open access: yesФізика і хімія твердого тіла, 2018
The results of the researching of thermoelectric properties of samples, which are obtained by compressingmechanical mixtures of microdisperse powders PdTe and CdTe, are presented.
O.M. Matkivsky   +7 more
doaj   +1 more source

Convective Heat Transport in Bidirectional Water Driven Hybrid Nanofluid Using Blade Shaped Cadmium Telluride and Graphite Nanoparticles under Electromagnetohydrodynamics Process

open access: yesJournal of Mathematics, 2022
The recent progress in nanotechnology provides the concept of hybrid-class nano-fluids having advanced thermal features comparing to regular nanofluids. The idea of a hybrid nanofluid has motivated many researchers because of its convincible performance ...
Iftikhar Ahmad   +5 more
doaj   +1 more source

Optimizing CdZnTeSe Frisch-Grid Nuclear Detector for Gamma-Ray Spectroscopy

open access: yesIEEE Access, 2020
Wide bandgap semiconductor materials capable of detecting X-rays and gamma-rays at room temperature without cryogenic cooling have great advantages that include portability and wide-area deployment in nuclear and radiological threat defense.
Stephen U. Egarievwe   +6 more
doaj   +1 more source

A mathemetical model of the charge accumulation and the spectrum formation in detectors on the basis of CdTe (CdZnTe) at the gamma-quanta irradiation [PDF]

open access: yesФизико-химические аспекты изучения кластеров, наноструктур и наноматериалов, 2017
The features of spectrum formation in CdTe (CdZnTe) detectors under gamma quanta radiation are presented. The main characteristics of a semiconductor detector, i.e. the energy resolution and the registration efficiency, are determined. The results can be
A.A. Smirnov   +3 more
doaj   +1 more source

Impact of Polyamide Surface Preparation on the Formation of Mixed CdS-CdTe Layers

open access: yesCrystals, 2023
CdTe-CdS layers were formed on polyamide (PA) 6 films with different surface modifications using the sorption-diffusion method. Part of the samples of the PA films was boiled in distilled water for 2 h and the other ones were stored in concentrated ...
Migle Liudziute   +3 more
doaj   +1 more source

MCT APD Detection System for Atmospheric Profiling Applications Using Two-Micron Lidar [PDF]

open access: yesEPJ Web of Conferences, 2020
An advanced detection system, based on mercury cadmium telluride avalanche photodiodes array, was implemented within a 2-μm lidar. Detection system characterization was conducted for performance evaluation including settling time, noise-equivalent-power (
Refaat Tamer F.   +3 more
doaj   +1 more source

Increasing the Conductivity of Cadmium Telluride Films [PDF]

open access: yesEngineering and Technology Journal, 2009
The structural , optical and electrical properties of vacuum-evaporated CdTe thin films were investigated as a function of post-deposition annealing without and with CdCl2 treatment at 300˚C for 15min .
Muslm Fadhel Al-Zubadi   +1 more
doaj   +1 more source

Birefringent cadmium–telluride-based metamaterial

open access: yesApplied Physics Letters, 2004
A CdTe-based optical metamaterial, with large induced optical birefringence (4%), has been produced and its optical properties fully characterized and modeled over the spectral range 1500– 450 nm. This metamaterial, which is related to mesoporous silica, is made using electrochemical deposition in the presence of a lyotropic liquid crystal template ...
Markham, M.L.   +6 more
openaire   +4 more sources

Ellipsometric Analysis of Cadmium Telluride Films’ Structure

open access: yesAdvances in Materials Science and Engineering, 2015
Ellipsometric analysis of CdTe films grown on Si and CdHgTe substrates at the “hot-wall” epitaxy vacuum setup has been performed. It has been found that ellipsometric data calculation carried out by using a simple one-layer film model leads to radical ...
Anna Evmenova   +3 more
doaj   +1 more source

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