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The precise measurement of capacitance
Proceedings of the IEE Part C: Monographs, 1954The method described is designed for industrial application and its purpose is to enable capacitance to be conveniently measured with a precision approaching that achieved by the National Physical Laboratory-on whom reliance is placed as the standardizing authority.
J.K. Webb, H.B. Wood
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An on-chip coupling capacitance measurement technique
VLSI Design 2001. Fourteenth International Conference on VLSI Design, 2002We describe a technique for the accurate measurement of on-chip coupling capacitance using a Charge Based Coupling Capacitance Measurement (CBCCM) Technique. Detailed circuit simulations show that this method can measure sub-femtofarad coupling capacitance values, and can be used to isolate and measure components of device capacitance as well.
NAIR, PA, GUPTA, A, DESAI, MP
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Non-contact voltage measurement using electronically varying capacitance
A voltage measurement methodology is presented, based on the principle of a vibrating capacitance, but implemented electronically. A transconductor with time-varying gain synthesises the vibrating capacitance, the peak to peak charge current of which ...
McKenzie, G., Record, P.
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Capacitive sensor for relative angle measurement
Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066], 2002Based on a capacitive angle and angular rate sensor, a sensor measuring the relative angle between two rotating shafts has been developed. Two rotatable electrodes are placed between two sensor plates. The relative angle between the two rotors and the absolute position of the rotor blades are calculated from measurements of the capacitive coupling ...
Paul L. Fulmek +4 more
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The precision measurement of capacitance
Proceedings of the Physical Society, 1939The paper describes a method for the measurement of capacitance in terms of mutual inductance and resistance. The circuit is developed from the Carey-Foster bridge, and a combination of two bridge circuits used successively leads to the elimination of small correcting terms. The power factor also of the condenser under test is determined. The values of
N F Astbury, L H Ford
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Capacitance measurements of an SOI based CMUT
2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS), 2013Capacitance measurement results for an SOI based CMUT are presented. Measurement results show that the variation in capacitance change as a function of both DC bias and AC excitation is considerably higher than analytically calculated values. Investigation shows that this deviation in capacitance from analytically calculated values is due to the ...
Jonathan Hernandez +2 more
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Device for measuring capacitance
Measurement Techniques, 1995A description is given of a device for measuring the capacitance of capacitative transducers. The measuring circuit uses a nonlinear twin-T four-terminal network in a pulse width balancing regime. An expression is obtained for the transfer function of the device, and the results of experimental studies are given.
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Measuring stray capacitance on tester hardware
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 2002Parasitic capacitance in test hardware can affect the performance of a test and lead to poor fault coverage and/or yield loss. In an ATE setup, characterizing the stray capacitance using external instruments is difficult for practical reasons. In this paper, we present a single probe technique that uses available tester resources to measure stray ...
Achintya Halder +3 more
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The Effect of Rotor Plates on Capacitive Measurement in Capacitive Encoders
2020 International Congress on Human-Computer Interaction, Optimization and Robotic Applications (HORA), 2020The moving plates of the capacitive encoders are called rotors and the fixed plates are called stators. In this study, the effects of the rotor plates on capacitive measurement for capacitive encoders are analyzed. Encoders are used in angular position measurement.
Emrehan YAVSAN +3 more
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Direct Measurement of Capacitance
IETE Journal of Research, 1976A method of measurement of capacitance is described wherein the unknown capacitance can be directly read. Measurements are done using 1 MHz stable crystal controlled oscillator. A two stage amplifier is used to amplify the low level signal before it is rectified and displayed.
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