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Charge Collection Microscopy and Cathodoluminescence
1995Abstract Charge collection imaging in the scanning electron microscope, often known by the acronym EBIC (electron beam-induced current), has become a widely used technique for the characterization of semiconductor materials and devices (Leamy, 1982; Holt and Joy, 1990).
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Charge collection and SEU mechanisms
Radiation Physics and Chemistry, 1994Abstract In the interaction of cosmic ions with microelectronic devices a dense electron-hole plasma is created along the ion track. Carriers are separated and transported by the electric field and under the action of the concentration gradient. The subsequent collection of these carriers induces a transient current at some electrical node of the ...
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Charge Collection and Charge Sharing in a 130 nm CMOS Technology
IEEE Transactions on Nuclear Science, 2006Charge sharing between adjacent devices can lead to increased Single Event Upset (SEU) vulnerability. Key parameters affecting charge sharing are examined, and relative collected charge at the hit node and adjacent nodes are quantified. Results show that for a twin-well CMOS process, PMOS charge sharing can be effectively mitigated with the use of ...
Oluwole A. Amusan +8 more
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Charge collection efficiency of CdTe detectors: impact of charge collection time and polarisation
Medical Imaging 2023: Physics of Medical Imaging, 2023Maxime Daniel +3 more
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Calorimeters With Charge-Collection Readout
1989This short review will be concerned with questions which arise in the design and construction of calorimeters whose common feature is that the signal is derived by drifting charge, deposited in a sensitive medium by showers induced by the interaction of photons, electrons or hadrons, under the influence of an electric field.
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Collective excitations in charged nanocrystals
2005We present self-consistent tight binding calculations of the dielectric response of charged semiconductor nanocrystals. We predict collective effects such as the oscillation in opposite phase of the additional electron and of the plasma of valence electrons near the resonance.
Delerue, Christophe +2 more
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Limits in charged-particle collection by charged drops
Environmental Science & Technology, 1982K H, Leong, J J, Stukel, P K, Hopke
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An inverse problem of charge-collection microscopy
Inverse Problems, 1986The author obtains the depth distribution of the charge-collection probability in a semiconductor device from collection efficiency measurements, when the electron generation function is a third-degree polynomial. The analytical problem is to find \(\phi\) (x), where \(\eta (x)=\int^{x}_{x_ 0}\sum^{3}_{0}a_ n(z/x)^ n \phi (z)dz\) is known for suitable ...
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Collective Effects in Charge Density Waves
1987In this talk I will discuss the classical deformable model of charge density wave (CDW) transport, which has been investigated extensively since its introduction by Fukuyama and Lee (1978) and Lee and Rice (1979) (here referred to as FLR). In a one hour talk it is totally impossible to review the field adequately, so these notes will necessarily ...
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Charge collection efficiency of Silicon Lithium detectors for charged particles
2019Trabajo presentado en el 23rd International Conference on Ion Beam Analysis (IBA 2017), celebrada en Shanghai (China) del 8 al 13 de octubre de ...
Jiménez-Ramos, M. C. +3 more
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