Results 41 to 50 of about 1,953,452 (184)

A new model for surface potential decay of corona-charged polymers [PDF]

open access: yes, 2010
Surface potential measurement provides a useful tool to gauge the electrical properties of materials. It has been observed that the potential of a sample with an initial high surface potential decays faster than that with an initial lower surface ...
Chen, George
core   +1 more source

Coulomb Driven Electro-Convection within Two Stacked Layers of Miscible Dielectric Liquids

open access: yesFluids
This article investigates the behavior of two parallel layers of different miscible dielectric liquids enclosed and sandwiched between two electrodes. By applying an electric potential to one electrode while grounding the other, electro-convection occurs
Philippe Traore   +5 more
doaj   +1 more source

Space charge measurement and analysis in low density polyethylene films

open access: yes, 2009
The growing requirement of reliability for an insulation system gives researchers greater responsibility to investigate new techniques for monitoring and diagnosing dielectrics subjected to an electric field.
Xu, Zhiqiang
core   +1 more source

A 55 V, 6.6 nV/√Hz Chopper Operational Amplifier with Dual Auto-Zero and Common-Mode Voltage Tracking

open access: yesEng
For high-voltage signal detection applications, an auto-zero and chopper operational amplifier (OPA) is proposed in this paper. With the auto-zero and chopper technique, the OPA adopts an eight-channel Ping-Pong mechanism to reduce the high-frequency ...
Zhifeng Chen   +3 more
doaj   +1 more source

High-field current transport and charge trapping in buried oxide of SOI materials under high-field electron injection

open access: yesJournal of Telecommunications and Information Technology, 2004
Mechanisms of the charge transfer, the charge trapping, and the generation of positive charge during the high-field electron injection into buried oxide of silicon-on-insulator structures fabricated by different technologies are analyzed based on the ...
Alexei N. Nazarov   +2 more
doaj   +1 more source

DC electric field distribution in planar dielectric in the presence of space charge [PDF]

open access: yes, 2007
Electric field in a dielectric material under dc conditions is determined by conductivity of the material. It is well known that the dc conductivity is a function of both temperature and electric field.
Z. Xu   +5 more
core   +2 more sources

Design of a 12-Bit 200MS/S CMOS Sample-and-Hold Circuit [PDF]

open access: yesJournal of Intelligent Procedures in Electrical Technology, 2014
In this paper, a new 12bit, 200MS/s fully differential sample and hold circuit is presented. In order to increase the linearity and input voltage dynamic range; bootstrapped-switches are used for sampling the input signal.
Hamid Mahmoodian, Mehdi Dolatshahi
doaj  

Readily Tunable Surface Potential by Functionalizing Pentacene with Dipole Monolayers

open access: yesAdvanced Electronic Materials
The surface potential of a prototypical organic semiconductor, pentacene, is chemically modified by the addition of a dipole monolayer on top of the thin film. Changes are afforded by reacting the topmost layer of pentacene to generate the monolayer, and
Matthew C. Williams   +4 more
doaj   +1 more source

Experimental Study on the Performance of Light-Controlled Ion Drag Pump Based on PLZT Ceramic

open access: yesMicromachines
Light-controlled ion drag pumps have attracted considerable interest in soft robotics, biomedical engineering, and microelectromechanical systems (MEMS) due to their non-contact energy supply and high spatiotemporal controllability of light.
Yujuan Tang   +4 more
doaj   +1 more source

Improvement of Charge Injection by Using Separated SiN as Charge Trapping Layer in MONOS Charge Trap Flash Memory

open access: yesIEEE Journal of the Electron Devices Society, 2018
The charge trapping characteristics in the metal-oxide-nitride-oxide-silicon memory with separated trapping layer were investigated. Charge injection was enhanced for the reduction of effective oxide thickness of the gate dielectric.
Hao Ji, Yehui Wei, Pengfei Ma, Ran Jiang
doaj   +1 more source

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