Results 81 to 90 of about 6,632 (142)

Side-wall metallization process for enhanced electrical contact in SOI-based MEMS switches

open access: yesMicro and Nano Engineering
MEMS inertial switches provide a zero-power alternative to conventional accelerometers by mechanically closing an electrical contact only when a specific acceleration threshold is exceeded.
Inês S. Garcia   +9 more
doaj   +1 more source

A Mechanical Model for Erosion in Copper Chemical-Mechanical Polishing [PDF]

open access: yes, 2003
The Chemical-mechanical polishing (CMP) process is now widely employed in the ultralarge scale integration chip fabrication. Due to the continuous advances in semiconductor fabrication technology and decreasing sub-micron feature size, the ...
Chun, Jung-Hoon   +2 more
core  

Mitigating Galvanic Corrosion of Molybdenum Diffusion Barriers in Chemical Mechanical Planarization of Copper Interconnects: A Case Study Using Imidazole in a Citrate Slurry of Neutral pH

open access: yesElectrochem
Molybdenum (Mo) is currently considered as a potential diffusion barrier material for copper (Cu) interconnects, and these interconnect structures are generally processed using the technique of chemical mechanical planarization (CMP).
Kassapa U. Gamagedara, Dipankar Roy
doaj   +1 more source

5 x 20 Gb/s heterogeneously integrated III-V on silicon electro-absorption modulator array with arrayed waveguide grating multiplexer [PDF]

open access: yes, 2015
Bauwelinck, Johan   +15 more
core   +1 more source

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