Results 1 to 10 of about 128 (97)

Chemical Mechanical Planarization and Old Italian Violins [PDF]

open access: yesMicromachines, 2018
Previous studies have shown that spectral analysis based on force data can elucidate fundamental physical phenomena during chemical mechanical planarization (CMP). While it has not been literally described elsewhere, such analysis was partly motivated by
Ara Philipossian   +2 more
doaj   +3 more sources

Particle Technology in Chemical Mechanical Planarization

open access: yesKONA Powder and Particle Journal, 2014
In order to keep pace with Moore’s law, multilevel metallization has become the process of choice. Having a planar wafer surface before every successive step in multilevel metallization is important. The Chemical
Kalyan S. Gokhale, Brij M. Moudgil
doaj   +3 more sources

Colloid Aspects of Chemical-Mechanical Planarization

open access: yesKemija u Industriji, 2010
The essential parts of interconnects for silicon based logic and memory devices consist of metal wiring (e.g. copper), a barrier metal (Ta, TaN), and of insulation (SiO2 , low-k polymer).
Matijević, E., Babu, S. E.
doaj   +1 more source

Electrolytically Ionized Abrasive-Free CMP (EAF-CMP) for Copper

open access: yesApplied Sciences, 2021
Chemical–mechanical polishing (CMP) is a planarization process that utilizes chemical reactions and mechanical material removal using abrasive particles.
Seonghyun Park, Hyunseop Lee
doaj   +1 more source

Chemical–Mechanical Polishing of 4H Silicon Carbide Wafers

open access: yesAdvanced Materials Interfaces, 2023
4H silicon carbide (4H‐SiC) holds great promise for high‐power and high‐frequency electronics, in which high‐quality 4H‐SiC wafers with both global and local planarization are cornerstones.
Wantang Wang   +6 more
doaj   +1 more source

In Situ Metrology for Pad Surface Monitoring in CMP Using a Common-Path Phase-Shifting Interferometry: A Feasibility Study

open access: yesApplied Sciences, 2021
In the fabrication of semiconductors, chemical mechanical polishing (CMP) is an essential wafer-planarization process. For optimal CMP, it is crucial to monitor the texture of the polishing pad; this leads to homogenous planarization of wafers. Hence, we
Eun-Soo Kim, Woo-June Choi
doaj   +1 more source

Investigation of the Two-Way Injection Slurry-Supply Method for the Cu CMP Process

open access: yesApplied Sciences, 2023
The effect of the two-way injection method during a copper chemical mechanical planarization (CMP) process was investigated. The two-way slurry-injection method has the advantage of not only preventing the degradation of the slurry, but also shortening ...
Chulwoo Bae   +4 more
doaj   +1 more source

Suppression of Dissolution Rate via Coordination Complex in Tungsten Chemical Mechanical Planarization

open access: yesApplied Sciences, 2022
Topography of tungsten should be assured at a minimum through chemical mechanical planarization (CMP) in the metal gate structures (e.g., buried gates, replacement metal gates) and via contact in the middle of line (MOL) process for sub−7 nm ...
Kangchun Lee, Jihoon Seo
doaj   +1 more source

Analysis of Correlation between Pad Temperature and Asperity Angle in Chemical Mechanical Planarization

open access: yesApplied Sciences, 2021
Chemical mechanical planarization (CMP) is a technology widely employed in device integration and planarization processes used in semiconductor fabrication. In CMP, the polishing pad plays a key role both mechanically and chemically.
Seonho Jeong   +3 more
doaj   +1 more source

Chemical-Mechanical Impact of Nanoparticles and pH Effect of the Slurry on the CMP of the Selective Layer Surfaces

open access: yesLubricants, 2017
This paper provides a tribochemical study of the selective layer surface by chemical mechanical planarization (CMP). CMP is used to remove excess material obtained in the process of selective transfer.
Filip Ilie, George Ipate
doaj   +1 more source

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