Results 31 to 40 of about 6,682 (189)

Enhanced Virtual Metrology on Chemical Mechanical Planarization Process using an Integrated Model and Data-Driven Approach

open access: yesInternational Journal of Prognostics and Health Management, 2017
As an essential process in semiconductor manufacturing, Chemical Mechanical Planarization has been studied in recent decades and the material removal rate has been proved to be a critical performance indicator.
Yuan Di, Xiaodong Jia, Jay Lee
doaj   +1 more source

Dynamic Pad Surface Metrology Monitoring by Swing-Arm Chromatic Confocal System

open access: yesApplied Sciences, 2020
This study aims to develop a dynamic pad monitoring system (DPMS) for measuring the surface topography of polishing pad. Chemical mechanical planarization/polishing (CMP) is a vital process in semiconductor manufacturing. The process is applied to assure
Chao-Chang A. Chen   +4 more
doaj   +1 more source

Engineering SiO2 Nanoparticles: A Perspective on Chemical Mechanical Planarization Slurry for Advanced Semiconductor Processing

open access: yesKONA Powder and Particle Journal, 2023
Chemical mechanical polishing (CMP) is a process that uses mechanical abrasive particles and chemical interaction in slurry to remove materials from the surface of films. With advancements in semiconductor device technology applying various materials and
Ganggyu Lee   +4 more
doaj   +1 more source

Integration of InP and InGaAs on 300 mm Si wafers using chemical mechanical planarization [PDF]

open access: yes, 2016
Integration of III-V high mobility channel materials in complementary metal oxide semiconductors (CMOS) and III-V photonic materials for integrated light sources on Si substrates requires low defect density III-V buffer layers in order to enable ...
Orzali, Tommaso   +4 more
core   +2 more sources

Slurry Design for Chemical Mechanical Polishing

open access: yesKONA Powder and Particle Journal, 2014
Chemical Mechanical Polishing (CMP) process is widely used in the microelectronics industry for planarization of metal and dielectric layers to achieve multi-layer metallization.
G. Bahar Basim, Brij M. Moudgil
doaj   +1 more source

Hybrid CMP Slurry Supply System Using Ionization and Atomization

open access: yesApplied Sciences, 2021
Chemical mechanical planarization (CMP) is frequently used in semiconductor manufacturing to polish the surfaces of multiple layers in a wafer. The CMP uses a slurry that aids in fabricating a smooth surface by removing the excess materials.
Hoseong Jo   +4 more
doaj   +1 more source

Double-walled carbon nanotube-based polymer composites for electromagnetic protection. [PDF]

open access: yes, 2010
In this paper, we present a microwave absorber based on carbon nanotubes (CNT) dispersed inside a BenzoCycloButenw (BCB) polymer. The high aspect ratio and remarkable conductive characteristics of CNT give rise to good absorbing properties for ...
Bianco   +10 more
core   +2 more sources

Copper removal from semiconductor CMP wastewater in the presence of nano-SiO2 through biosorption

open access: yesWater Reuse, 2021
Copper-bearing wastewater from chemical mechanical planarization (CMP) is a typical semiconductor development byproduct. How to effectively treat Cu2+ in the CMP wastewater is a great concern in the microchip manufacturing industry.
Xiaoyu Wang   +4 more
doaj   +1 more source

Packaging technology enabling flexible optical interconnections [PDF]

open access: yes, 2011
This paper reports on the latest trends and results on the integration of optical and opto-electronic devices and interconnections inside flexible carrier materials.
Bosman, Erwin   +5 more
core   +1 more source

Oxidation differences on Si- versus C-terminated surfaces of SiC during planarization in the fabrication of high-power, high-frequency semiconductor device

open access: yesScientific Reports, 2023
Silicon carbide (SiC) wafers have attracted attention as a material for advanced power semiconductor device applications due to their high bandgap and stability at high temperatures and voltages. However, the inherent chemical and mechanical stability of
Ganggyu Lee   +7 more
doaj   +1 more source

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