Results 41 to 50 of about 6,682 (189)

Particulate Science and Technology in the Engineering of Slurries for Chemical Mechanical Planarization

open access: yesKONA Powder and Particle Journal, 2014
Chemical Mechanical Planarization (CMP) is a process that is now routinely used to planarize metal as well dielectric films during the fabrication of integrated circuits.
Srini Raghavan   +2 more
doaj   +1 more source

Characterization Of Thermal Stresses And Plasticity In Through-Silicon Via Structures For Three-Dimensional Integration [PDF]

open access: yes, 2014
Through-silicon via (TSV) is a critical element connecting stacked dies in three-dimensional (3D) integration. The mismatch of thermal expansion coefficients between the Cu via and Si can generate significant stresses in the TSV structure to cause ...
Ho, P. S.   +4 more
core   +1 more source

Review on atomistic and quantum mechanical simulation approaches in chemical mechanical planarization

open access: yesApplied Surface Science Advances
Chemical mechanical planarization (CMP) faces critical challenges including non-uniform material removal, surface defect generation, and complex tribochemical interactions that limit process control at advanced semiconductor nodes.
Seokgyu Ryu   +5 more
doaj   +1 more source

Investigation of slurry composition and triboelectrochemical effects on copper electrochemical–mechanical polishing

open access: yesInternational Journal of Electrochemical Science
Copper electrochemical mechanical polishing (ECMP) is a critical planarization technique for advanced integrated circuit manufacturing, particularly as feature sizes shrink below 65 nm and low‑k dielectrics—vulnerable to mechanical damage—are ...
Yan-Fei Bian   +3 more
doaj   +1 more source

Single-charge devices with ultrasmall Nb/AlOx/Nb trilayer Josephson junctions

open access: yes, 2004
Josephson junction transistors and 50-junction arrays with linear junction dimensions from 200 nm down to 70 nm were fabricated from standard Nb/AlOx/Nb trilayers.
A. B. Zorin   +4 more
core   +1 more source

Co-integration of Ge detectors and Si modulators in an advanced Si photonics platform [PDF]

open access: yes, 2012
A Si photonics platform is described, co-integrating advanced passive components with Si modulators and Ge detectors. This platform is developed on a 200mm CMOS toolset, compatible with a 130nm CMOS baseline.
Absil, Philippe   +8 more
core   +1 more source

An ohmic RF MEMS switch for reconfigurable microstrip array antennas built on PCB [PDF]

open access: yes, 2008
This paper presents the analysis, design and simulation of an ohmic RF MEMS switch specified for reconfigurable microstrip array antennas built on PCB via an integrated monolithic technology.
Charalampidis, N   +6 more
core  

Spectroscopic ellipsometry on thin titanium oxide layers grown on titanium by plasma oxidation [PDF]

open access: yes, 2011
: Electronic devices based on tunnel junctions require tools able to accurately control the thickness of thin metal and oxide layers on the order of the nanometer.
Beaumont, A.   +3 more
core   +2 more sources

Experimental Strategies for Studying Tribo-Electrochemical Aspects of Chemical–Mechanical Planarization

open access: yesLubricants
Chemical–mechanical planarization (CMP) is used to smoothen the topographies of a rough surface by combining several functions of tribology (friction, lubrication), chemistry, and electrochemistry (corrosion, wear, tribo-corrosion).
Kassapa Gamagedara, Dipankar Roy
doaj   +1 more source

On the design of an Ohmic RF MEMS switch for reconfigurable microstrip antenna applications [PDF]

open access: yes, 2009
This paper presents the analysis, design and simulation of a direct contact (dc) RF MEMS switch specified for reconfigurable microstrip array antennas.
D. Kampitaki   +7 more
core   +2 more sources

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