Results 21 to 30 of about 12,532,430 (255)
RTS noise impact in CMOS image sensors readout circuit [PDF]
, 2009 CMOS image sensors are nowadays widely used in imaging applications even for high end applications. This is really possible thanks to a reduction of noise obtained, among others, by Correlated Double Sampling (CDS) readout.
P. Magnan +3 more
core +1 more source
Radiation Effects on CMOS Image Sensors With Sub-2 µm Pinned Photodiodes [PDF]
, 2012 CMOS image sensor hardness under irradiation is a key parameter for application fields such as space or medical. In this paper, four commercial sensors featuring different technological characteristics (pitch, isolation or buried oxide) have been ...
Place, Sébastien +5 more
core +1 more source
High performances monolithic CMOS detectors for space applications [PDF]
, 2001 During the last 10 years, research about CMOS image sensors (also called APS -Active Pixel Sensors) has been intensively carried out, in order to offer an alternative to CCDs as image sensors.
Franck Corbiere +17 more
core +1 more source
Design and Fabrication of Vertically-Integrated CMOS Image Sensors
Sensors, 2011 Technologies to fabricate integrated circuits (IC) with 3D structures are an emerging trend in IC design. They are based on vertical stacking of active components to form heterogeneous microsystems.
Orit Skorka, Dileepan Joseph
doaj +1 more source
Novel readout circuit architecture for CMOS image sensors minimizing RTS noise [PDF]
, 2011 This letter presents a novel readout architecture and its associated readout sequence for complementary metal–oxide– semiconductor (CMOS) image sensors (CISs) based on switch biasing techniques in order to reduce noisy pixel numbers induced by in-pixel
Philippe Martin-Gonthier +3 more
core +1 more source
IEEE Journal of the Electron Devices Society, 2015 This paper presents a CMOS time-of-flight (ToF) range image sensor using high-speed lock-in pixels with background light canceling capability. The proposed lock-in pixel uses MOS gate-induced lateral electric field control of depleted potential of pinned
Sang-Man Han +5 more
doaj +1 more source
In-Pixel source follower transistor RTS noise behavior under ionizing radiation in CMOS image sensors [PDF]
, 2012 This paper presents temporal noise measurement results for several total ionizing dose (TID) steps up to 2.19 Mrad of an image sensor designed with a 0.18-μm CMOS image sensor process.
Goiffon, Vincent +2 more
core +1 more source
Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes [PDF]
, 2011 Selected radiation hardened photodiode layouts, manufactured in a deep submicron CMOS Image Sensor technology, are irradiated by 60Co gamma-rays up to 2.2 Mrad(SiO2) and studied in order to identify the most efficient structures and the guidelines ...
V. Goiffon +11 more
core +1 more source
Robust Dehaze Algorithm for Degraded Image of CMOS Image Sensors
Sensors, 2017 The CMOS (Complementary Metal-Oxide-Semiconductor) is a new type of solid image sensor device widely used in object tracking, object recognition, intelligent navigation fields, and so on.
Chen Qu +4 more
doaj +1 more source
A Non-Contact Pulse Automatic Positioning Measurement System for Traditional Chinese Medicine
Sensors, 2015 This study is to construct a non-contact pulse automatic positioning measurement system for Traditional Chinese Medicine (TCM) using optical triangulation measurements.
Ying-Yun Chen +4 more
doaj +1 more source