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Potential slack: an effective metric of combinational circuit performance

IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140), 2002
Chunhong Chen   +2 more
openaire   +1 more source

Combined no-reference IQA metric and its performance analysis

IS&T International Symposium on Electronic Imaging, 2019
Oleg Ieremeiev, Vladimir Lukin
exaly  

DETERMINING A COMBINED COMPLIANCE ASSESSMENT METRIC

2023
CHIN TIFFANY JOY   +3 more
openaire   +1 more source

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