Results 141 to 150 of about 2,200,532 (289)

Achieving Ultra‐Low Contact Resistance via Copper‐Intercalated Bilayer MoS2

Advanced Electronic Materials
The high contact resistance between MoS2 and metals hinders its potential as an ideal solution for overcoming the short‐channel effect in silicon‐based FETs at sub‐3 nm scales.
Huan Wang, Xiaojie Liu, Hui Wang, Yin Wang, Haitao Yin   +4 more
doaj   +1 more source

Characterization of a Recyclate‐Based MgO‐Steel Composite As‐Sintered Inert Anode Candidate After Exposure to Cryolite Electrolysis

Advanced Engineering Materials, EarlyView.
Carbon‐free inert anodes are essential for decarbonizing aluminum electrolysis. This study investigates a recyclate‐based MgO‐316L steel composite anode tested under galvanostatic Hall–Héroult conditions in cryolite at 1000°C. Microstructural analysis reveals selective MgO fluorination, spinel and oxide layer formation, electrolyte infiltration, and ...
Serhii Yaroshevskyi, Alexander Adamczyk, Nora Brachhold, Gert Schmidt, Jana Hubálková, R. Gumeniuk, Alexandros Charitos, Christos G. Aneziris   +7 more
wiley   +1 more source

Realization of a Test Tool for Diagnosis of Contact Resistance and Measurement of Selected Types of Conductive Materials. [PDF]

Sensors (Basel), 2023
Kacor P, Bernat P, Mlcak T, Hrabovsky L.
europepmc   +1 more source

Charge Relaxation in the Presence of Shot Noise in Coulomb Coupled Mesoscopic Systems

, 1999
In the presence of shot noise the charge on a mesoscopic conductor fluctuates. We are interested in the charge fluctuations which arise if the conductor is in the proximity of a gate to which it is coupled by long range Coulomb forces only.
Buttiker, Markus
core   +1 more source

Influence of an Oxygen‐Free Atmosphere on Diamond‐Single‐Grain Scratching of Ti–6Al–4V

Advanced Engineering Materials, EarlyView.
Single‐grain scratching of Ti–6Al–4V is investigated under controlled, oxygen‐free, and ambient atmospheres using a novel experimental setup with in situ high‐speed imaging. The approach enables direct observation of chip formation and adhesion under suppressed oxidation.
Berend Denkena, Benjamin Bergmann, Michael Zenger   +2 more
wiley   +1 more source

Ultralow contact resistance in organic transistors via orbital hybridization. [PDF]

Nat Commun, 2023
Zeng J, He D, Qiao J, Li Y, Sun L, Li W, Xie J, Gao S, Pan L, Wang P, Xu Y, Li Y, Qiu H, Shi Y, Xu JB, Ji W, Wang X.   +16 more
europepmc   +1 more source

Population of Nonmetallic Inclusions in Liquid High‐Silicon Electrical Steel in Contact With MgO–C Refractories Based on Recyclates and Environmentally Friendly Binders

Advanced Engineering Materials, EarlyView.
The formation of nonmetallic inclusions (NMIs) was investigated in this study, carrying out immersion tests for 30 min at a temperature of 1600°C with liquid high‐silicon electrical steel (Si ≈ 3 mass‐%) and different MgO–C refractories. Conventional MgO–C refractories were considered, as well as MgO–C refractories containing MgO–C recyclate and ...
Lukas Neubert, Matheus Roberto Bellé, Florian Kerber, Dinesh Kumar Gunasekar, Hans‐Jörn Weddige, Christos G. Aneziris, Olena Volkova   +6 more
wiley   +1 more source

Al–Cu Composite Casting of Laser‐Deoxidized Copper: Bonding, Interfacial Chemistry, and Thermal Conductivity

Advanced Engineering Materials, EarlyView.
This study investigates laser‐based oxide removal of Cu inserts in oxygen‐free conditions and examines long‐term oxidation kinetics and surface chemistry under different atmospheres via X‐ray photoelectron spectroscopy. Al–Cu compound casting with differently oxidized surfaces is performed, and intermetallic phase formation, morphology, and thermal ...
Timon Steinhoff, Finn‐Lennard Janthur, Sascha Zimmermann, Sarah Seffer, Jörg Hermsdorf, René Gustus, Ludger Overmeyer, Wolfgang Maus‐Friedrichs, Hans Jürgen Maier, Christian Klose   +9 more
wiley   +1 more source

High-Accuracy Contact Resistance Measurement Method for Liquid Metal by Considering Current-Density Distribution in Transfer Length Method Measurement. [PDF]

ACS Appl Mater Interfaces, 2023
Sato T, Iwase E.
europepmc   +1 more source

Contact resistance of neighboring multiple contact.

IEEJ Transactions on Power and Energy, 1985
Hisashi Aichi, Hanji Satone, Iwao Miyachi   +2 more
openaire   +2 more sources