Results 121 to 130 of about 2,466,920 (160)

Optoelectronic Characterization of Trap Density of States in Indium Gallium Oxide Thin-Film Transistors and Their Impact on Bias Stability. [PDF]

open access: yesACS Appl Mater Interfaces
Kim SY   +9 more
europepmc   +1 more source

Home - About - Disclaimer - Privacy