Results 271 to 280 of about 259,778 (317)
Some of the next articles are maybe not open access.
A DFT algorithm based on filter banks: the extended subband DFT
Proceedings 2003 International Conference on Image Processing (Cat. No.03CH37429), 2004A DFT algorithm, the extended subband DFT (ESB-DFT), is presented, which overcomes the problem of low accuracy the subband DFT (SB-DFT) S.K. Mitra et al., (1990) O.V. Shentov et al., (1991) suffers from when applied in its approximate mode for signals with full spectrum. The proposed ESB-DFT is based upon the analysis of the input signal using a filter
Eftychios V. Papoulis, Tania Stathaki
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Hermitian Symmetric DFT Codes: A New Class of Complex DFT Codes
IEEE Transactions on Signal Processing, 2012We introduce a new class of real number codes derived from DFT matrix, Hermitian symmetric DFT (HSDFT) codes. We propose a new decoding algorithm based on coding-theoretic as well as subspace based approach. Decoding of HSDFT codes requires only real arithmetic operations and smaller dimension matrices compared to the decoding of the state-of-art real ...
Kumar, A. Anil, Makur, Anamitra
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A Flexible Framework for Multidimensional DFTs
SIAM Journal on Scientific Computing, 2020zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Doru-Thom Popovici +3 more
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IEEE Design & Test of Computers, 1997
Advances in design characteristics and design processes are creating significant challenges to design for testability (DFT) and test. Are DFT and test capabilities developing at a pace that will not limit the rapid growth of the very large semiconductor and computing industries that rely on their capabilities?
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Advances in design characteristics and design processes are creating significant challenges to design for testability (DFT) and test. Are DFT and test capabilities developing at a pace that will not limit the rapid growth of the very large semiconductor and computing industries that rely on their capabilities?
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IEEE International Conference on Test, 2005., 2006
The author discusses about outsourcing analog/mixed-signal DFT. At present we still lack a "SAF" metric for measuring analog IC fault coverage, as most analog faults that are found by testing are of a parametric variety, and can not be measured or scored (as in the SAF coverage grade) by using Boolean techniques.
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The author discusses about outsourcing analog/mixed-signal DFT. At present we still lack a "SAF" metric for measuring analog IC fault coverage, as most analog faults that are found by testing are of a parametric variety, and can not be measured or scored (as in the SAF coverage grade) by using Boolean techniques.
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Tensor Product DFT Codes vs Standard DFT Codes
IEEE Transactions on Computers, 2019We present a new class of linear error-correcting codes taking numerical data into codewords with numerical symbols. These codes can correct large random numerical errors added to codewords. The goal is for numerical data to be protected directly as numbers whether in storage or transmission.
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DFTS on irregular grids: the anterpolated DFT
2013http://archive.org/details ...
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Alloy Digest, 2007
Abstract DFT (drawn filled tube) wire is a composite wire with a metallurgical bond between the core material and the tubing material. The bond develops unique properties for the composite material. Silver is a typical core material, although MP35N and 316LVM are also used.
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Abstract DFT (drawn filled tube) wire is a composite wire with a metallurgical bond between the core material and the tubing material. The bond develops unique properties for the composite material. Silver is a typical core material, although MP35N and 316LVM are also used.
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2019
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