Results 261 to 270 of about 64,466 (308)

The Thermal Dielectric Quotient for Characterizing Dielectric Heat Conductors

IEEE Transactions on Microwave Theory and Techniques, 1981
If a piece of dielectric is mounted between two conductors, the resulting thermal conductance and electrical capacitance are related by their quotient which is a property of the material, independent of the size and shape. This quotient is expressed in watts per (picofarad X kelvin).
H.A. Wheeler, R.A. Lodwig
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Characterization of dielectric materials

Journal of Materials Science, 1981
Recent examination of the form of the dielectric susceptibility as a function of frequency has shown the presence of power law behaviour at both low and high frequencies, with respect to the frequency of maximum loss. The magnitudes for the power law exponents of one hundred dielectric loss peaks are reported together with relevant experimental ...
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Dielectric Characterization of Polyceram Films

MRS Proceedings, 1990
ABSTRACTPolycerams are an emergent class of hybrid, multifunctional materials which combine the properties of organic and inorganic materials. Films have been prepared from silicon alkoxides and reactive, functionalized polymers such as triethoxysilyl modified polybutadiene (MPBD), (N-triethoxysilylpropyl)O polyethylene oxide urethane (MPEOU) and ...
G. Teowee, J.M. Boulton, H.H. Fox, A. Koussa, T. Gudgel, D.R. Uhlmann   +5 more
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Characterization of multicapillary dielectric cathodes

Applied Physics Letters, 2007
Parameters of the plasma and electron beam produced by a multicapillary cathode in a diode powered by a ∼200kV, ∼300ns pulse are presented. It was found that the source of electrons is the plasma ejected from the capillaries. Inside the capillaries this plasma obtains electron density and temperature of ∼8×1015cm−3 and ∼5eV, respectively.
J. Z. Gleizer, Y. Hadas, D. Yarmolich, J. Felsteiner, Ya. E. Krasik   +4 more
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Dielectric characterization of substituted diols

Liquid Crystals, 1997
Dielectric properties of four diols having different chemical structures of the hydrophobic part were determined by the time domain spectroscopy method in the frequency range from c. 15MHz to c. 7GHz. The static permittivity clearly reflects the changes in the position of the dipole moments in the molecules.
B. GESTBLOM, H. KRESSE, C. TSCHIERSKE, S. URBAN   +3 more
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Characterization of dielectric LTCC tapes

Proceedings of the 36th International Spring Seminar on Electronics Technology, 2013
Low Temperature Co-Fired Ceramic (LTCC) technology is one of the most widely used technologies for producing reliable electronic components, modules, and sensors, capable for working in high temperature applications and applications requiring low dielectric losses.
G. Miskovic, S. Toskov, A. Maric, N. Blaz, G. Radosavljevic   +4 more
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Broadband characterization of package dielectrics

53rd Electronic Components and Technology Conference, 2003. Proceedings., 2004
Testing of microelectronic package dielectric material samples using direct capacitance measurements with impedance tester equipment is typically limited to frequencies helow 1 GHz. To overcome this limitation we explore the use of a general-purpose vector network analyzer (VNA) for obtaining S parameters of "in situ" test lines on test coupons ...
H. Braunisch, null Dong-Ho Han
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Dielectric characterization of polycrystalline Sr2Bi4Ti5O18

Journal of Applied Physics, 1999
Five layered Sr2Bi4Ti5O18 has been prepared in the ceramic form with a view to studying its electrical properties. X-ray and microstructural studies were employed for physical characterization. Detailed electrical property measurements were undertaken so as to understand the basic transport physics of this compound.
Srinivas, K, James, AR
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Characterization of Dielectric Films

1983
Publisher Summary This chapter focuses on the characterization of dielectric films in metal-oxide-semiconductor (MOS) technology. The basic objective in characterization of dielectric materials is to isolate and define specific mechanisms that cause the characteristics of MOS devices to deviate from those predicted for an ideal device.
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Geometric and dielectric characterization of porous media

Physical Review B, 1991
This paper introduces local porosity distributions and local percolation probabilities as well-defined and experimentally observable geometric characteristics of general porous media. Based on these concepts the dielectric response is analyzed using the effective-medium approximation and percolation scaling theory.
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