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Measurement of the Dielectric Properties of Paper
NIP & Digital Fabrication Conference, 1998Unlike de resistivities of non-impact printing papers that are routinely measured, their dielectric properties are seldom considered. The do resistivity alone does not predict the behavior of paper very well when paper passes through a transfer nip. If the electric field changes with time, all anisotropic frequency-dependent electrical properties of ...
Simula, S. +5 more
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Dielectric property measurement of PLA
2016 IEEE International Conference on Electro Information Technology (EIT), 20163D printing technology provides an affordable method of prototyping antennas. To design antennas with this technology it is necessary to characterize the materials used for printing precisely in terms of their permittivity and conductivity. Two major groups of materials for antenna design are dielectric and conductive materials.
Eric Huber +5 more
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The measurement of discharges in dielectrics
Journal of the Institution of Electrical Engineers, 1936The importance is emphasized of being able to differentiate between an increase in the power factor of a dielectric due to gaseous ionization and an increase due to other causes. The necessity of being able to detect discharges before they have caused sufficient damage to give rise to a change in power factor is also pointed out.A description is given ...
A.N. Arman, A.T. Starr
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Dielectric dispersion of albumins. Studies of denaturation by dielectric measurement
Biochimica et Biophysica Acta (BBA) - Specialized Section on Biophysical Subjects, 1964Abstract The dielectric dispersion of bovine serum albumin and ovalbumin was studied before and after urea denaturation. Native bovine serum albumin was found to have an exceedingly small dielectric increment indicating that the charge distribution in this protein has a remarkably high degree of symmetry.
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Measurement of the permittivity of dielectrics
Measurement Techniques, 19681. Our experimental investigations have shown that the accuracy in measuring the polarization parameters and determining the e value depends mainly on the error in calibrating the polarizing and the analyzing devices, which, in our case, did not exceed 5–7%. 2.
S. I. Pozdnyak, G. N. Anikeenko
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Microwave Dielectric Measurements
Journal of Applied Physics, 1947The method of measurement of the dielectric properties of solid dielectrics described by S. Roberts and A. von Hippel has been applied with 3-cm wave-length waves in a rectangular wave guide. In this method the dielectric sample is placed at a short circuited end of the transmission line, and the dielectric properties of the sample, calculated from the
T. W. Dakin, C. N. Works
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An overview of dielectric measurements
IEEE Transactions on Electrical Insulation, 1990It is noted that, approximately 25 years ago, commercial electronic instruments were brought on the market that heralded a new era in dielectric measurements; this electronic era is now rapidly drawing to a close, and is on the verge of being eclipsed by an era that could be called intelligent instruments.
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Precision in dielectric measurements
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1975, 1975In this paper we shall survey measurements of dielectric properties of materials with respect to precision. We shall consider both optimum and extreme conditions, and try to indicate the source and magnitude of errors. To better acquaint conferees (and readers) with the National Bureau of Standards, we shall choose a disproportionate share of the ...
Martin G. Broadhurst, William P. Harris
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Measurements of the Dielectric Properties
2009Microwave characterization of bulk, thin and thick film ferroelectrics is considered in this chapter. Both single crystals and ceramics are discussed. The resonant techniques include disk, Courtney and composite resonator methods for characterization of the bulk ferroelectrics.
Anatoli Deleniv, Spartak Gevorgian
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A review of dielectric measurements
1950 Conference On Electrical Insulation, 1950This review of dielectric measurements is confined to the measurement of the complex dielectric constant of dielectrics, with no consideration whatever for the measurement of dielectric strength. Only measurement technique will be considered, with no reference to specific dielectric properties except as their magnitude and variation directly affect the
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