Results 251 to 260 of about 2,227,209 (298)

Stripline dielectric measurements

Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1968, 1968
A stripline method for measuring dielectric constant and loss tangent of sheet insulation, particularly of stripline laminates, offers several advantages for laboratory study and routine quality control of microwave dielectric properties at frequencies above 300 MHz: (1) a stripline test circuit meets the requirement that, since many useful stripline ...
Murray Olyphant, James H. Ball
openaire   +1 more source

Automated dielectric measurement

Physics Bulletin, 1978
In the study of the dielectric properties of materials by the Solid State Physics Group at Chelsea College, London, measurements are made in both the frequency and time domains under computer control. It is a feature of dielectric measurements that they involve a large range of either frequency or time, in addition to such common variables as ...
openaire   +1 more source

A Method for Measuring Dielectric Properties of Dielectric Laminates

2019 International Conference on Microwave and Millimeter Wave Technology (ICMMT), 2019
In order to determine the unknown complex permittivity of any microwave dielectric laminate, this paper describes a reliable and accurate method for obtaining the complex permittivity. The coaxial probe method is used as the first step to predict the complex permittivity of unknown dielectric laminates.
Kwok L. Chung, Shushuai Xie, Mengxin Guan, Lingling Wang, Botao Feng   +4 more
openaire   +1 more source

Dielectric parameters measurement with waveguide-dielectric resonator

ICMWFST'96. 1996 4th International Conference on Millimeter Wave and Far Infrared Science and Technology. Proceedings, 2002
The method of low loss dielectric parameters measurement using microwave resonator was suggested. For these measurements the main E/sub 011/ oscillation from axial-symmetrical oscillations class of waveguide-dielectric resonator was used. The measuring section used a circular waveguide part with partial dielectric filling of its cross-section.
R.I. Belous, Yu.G. Makeev, A.P. Motornenko   +2 more
openaire   +1 more source

Measurement of Dielectric Properties

2014
The ageing of the insulation of HV apparatus is not only caused by the high electric field strength but also by thermal and mechanical stresses that evolve during normal operation condition. This may lead to chemical processes associated with a gradual deterioration of the integral insulation properties.
Wolfgang Hauschild, Eberhard Lemke
openaire   +1 more source

Snow dielectric measurements

Advances in Space Research, 1989
Abstract Measurements of the dielectric constant and of the dielectric loss of Alpine snow with various stages of metamorphism are reported. The measurements covering the frequency range of up to 1GHz have been carried out in the natural snow cover; measurements in the microwave X-band (8 to 12 GHz) were recently made with natural snow samples in the
openaire   +1 more source

Measurements of dielectric constants

Physica, 1935
Summary A description is given of an apparatus for measuring dielectric constants Compactness of construction is combined with great ease of manipulation, highest accuracy and use of minute quantities of material. Attention is called to the fact that the measurement of dielectric constants is waiting for application in a large field of pure as well ...
openaire   +1 more source

Dielectric Measurements

International Journal of Electrical Engineering & Education, 1963
W. P. Baker, E. Kuffel
openaire   +1 more source

Measurement of Dielectric Properties

2016
This chapter reports on the apparatus used to measure the dielectric properties of microwave dielectrics as a function of temperature, consisting of a shielded dielectric resonator mounted upon the cold head of a cryogenic closed-cycle refrigerator.
openaire   +1 more source

Effect of Different Shapes on the Measurement of Dielectric Constants of Low-Loss Materials With Rectangular Waveguides at X-Band

IEEE Microwave and Wireless Components Letters, 2022
Hui Huang, Jianhua Yang, Shaohua Zhou
exaly