Results 11 to 20 of about 866,186 (255)

Fast measurement of the thickness and group refractive index distribution of solid plates by line-field dispersive interferometry.

Optics Express, 2022
Real-time measurement of the thickness and group refractive index is crucial for semiconductor devices. In this paper, we proposed a fast synchronous method for measuring the thickness and group refractive index distribution of solid plates based on line-
Jinxu Zhang, Shilin Xiong, Ruixue Zhang, Siyu Zhou, Xingyu Jia, Liheng Shi, B. Liu, Qinggai Mi, Guanhao Wu   +8 more
semanticscholar   +3 more sources

Simultaneous Measurement of Absolute Distance and Angle Based on Dispersive Interferometry

IEEE Photonics Technology Letters, 2020
We present a dispersive interferometry of optical frequency comb for simultaneous measuring absolute distance and angle. The reconfigured Michelson interferometer can emit two parallel measured beams and one reference beam.
Xu Liang, Jiarui Lin, Linghui Yang, Tengfei Wu, Yang Liu, Jigui Zhu   +5 more
semanticscholar   +3 more sources

Absolute angular measurement with optical frequency comb using a dispersive interferometry.

Optics Express, 2020
We have demonstrated a simple method to measure high-precision absolute angular displacement using an optical frequency comb (OFC). The dispersive interferometry with parallel configuration can take advantage of its large non-ambiguity range and achieve ...
Xu Liang, Jiarui Lin, Tengfei Wu, Linghui Yang, Yu Wang, Yang Liu, Jigui Zhu   +6 more
semanticscholar   +3 more sources

Characterizing short dispersion-length fiber via dispersive virtual reference interferometry.

Optics Express, 2014
The ability to characterize fibers with near-zero dispersion-length products is of considerable practical interest. We introduce dispersive virtual reference interferometry (DVRI) as a technique for the characterization of short length (
M. Galle, E. Zhu, S. Saini, Waleed S. Mohammed, L. Qian   +4 more
semanticscholar   +3 more sources

A review of dual-chirped-comb interferometry for fast long-distance ranging

APL Photonics
Laser-based light detection and ranging technology, a vital tool for fast long-range distance measurement, plays an essential role across both scientific and industrial fields.
Liang Xu, Chen Liu, Liao Chen, Chi Zhang, Xinliang Zhang   +4 more
doaj   +2 more sources

Dispersive Fourier transform based dual-comb ranging

Nature Communications
Laser-based light detection and ranging (LIDAR) offers a powerful tool to real-timely map spatial information with exceptional accuracy and owns various applications ranging from industrial manufacturing, and remote sensing, to airborne and in-vehicle ...
Bing Chang, Teng Tan, Junting Du, Xinyue He, Yupei Liang, Zihan Liu, Chun Wang, Handing Xia, Zhaohui Wu, Jindong Wang, Kenneth K. Y. Wong, Tao Zhu, Lingjiang Kong, Bowen Li, Yunjiang Rao, Baicheng Yao   +15 more
doaj   +2 more sources

Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser.

Optics Express, 2006
We describe an interferometric method that enables to measure the optical path delay between two consecutive femtosecond laser pulses by way of dispersive interferometry.
K. Joo, Seung-Woo Kim
semanticscholar   +3 more sources

Dispersive qubit measurement by interferometry with parametric amplifiers [PDF]

Physical Review B, 2014
We perform a detailed analysis of how an amplified interferometer can be used to enhance the quality of a dispersive qubit measurement, such as one performed on a superconducting transmon qubit, using homodyne detection on an amplified microwave signal ...
Sh. Barzanjeh, D. DiVincenzo, B. Terhal
semanticscholar   +5 more sources

Absolute group refractive index measurement of air by dispersive interferometry using frequency comb.

Optics Express, 2015
The absolute group refractive index of air at 1563 nm is measured by dispersive interferometry, and a combined uncertainty of 1.2 × 10(-8) is achieved.
Lin Yang, Hengkang Zhang, Yan Li, Haoyun Wei   +3 more
semanticscholar   +3 more sources

Mg-Doped P-Type AlN Thin Film Prepared by Magnetron Sputtering Using Mg-Al Alloy Targets [PDF]

Micromachines
Aluminum nitride (AlN), a III-V wide-bandgap semiconductor, has attracted significant attention for high-temperature and high-power applications. However, achieving p-type doping in AlN remains challenging.
Yulin Ma, Xu Wang, Kui Ma
doaj   +2 more sources