Results 191 to 195 of about 200,551 (195)
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Analysis and Optimization of Order Overlap in Echelle Imaging Spectrometers
IEEE Photonics Technology LettersLei Zhang +5 more
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Research on automatic spectral calibration algorithm for echelle spectrometer
Optics CommunicationsYanan Sun +6 more
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Far Infrared Detector Arrays for a SOFIA echelle spectrometer
1996Erickson, E.F., Haas, M., Wolf, J.
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