Results 171 to 180 of about 6,825 (205)

Echelle spectrometer for single shot elemental analysis

SPIE Proceedings, 1990
The paper presents a spectrometer combining echelles with imaging detectors and optimizing the echelle design to match the behavior of the detector, to be used for simultaneous high-resolution multiwavelength observations of a variety of discharges. The instrument utilizes a dual Czerny-Turner mount, with compensation of astigmatism generated in the ...
Alexander Scheeline, Cheryl A. Bye, Duane L. Miller, Steven W. Rynders   +3 more
openaire   +1 more source

A Low Cost Spectrographic Attachment for an Echelle Spectrometer

Applied Spectroscopy, 1983
The report describes a simple, low cost photographic attachment for an echelle spectrometer. The crossed dispersion prism/echelle grating system provides a high resolution spectrum in a compact two dimensional format. It has been estimated that the echelle spectrum obtained on a 4 by 5 in.
John M. Brackett, Joel C. Mitchell, Thomas J. Vickers   +2 more
openaire   +1 more source

Figures of merit for an ICP-echelle spectrometer system

Spectrochimica Acta Part B: Atomic Spectroscopy, 1982
Abstract Figures of merit of an ICP-echelle Spectrometer System are presented for 55 elements. The analytical importance of each figure of merit is discussed. The analytical results obtained with the ICP-echelle system compare well with previously published figures for ICP studies.
openaire   +1 more source

Optical Design of the ARC Echelle Spectrometer

1988
The high-dispersion spectrometer for the ARC 3.5-m telescope combines an echelle with prism cross-dispersion in an in-plane arrangement. This spectrometer will be located at an f/10 Nasmyth focus with an off-axis paraboloidal collimator and an f/2.7 Schmidt camera with achromatic corrector and CCD detector.
openaire   +1 more source

Optimization of a direct-current plasma emission echelle spectrometer

Analytica Chimica Acta, 1987
Abstract Simplex optimization and Box-Behnken partial factorial experimental design techniques were used to optimize the quantitative performance of a direct-current plasma system. Argon pressure and plasma position were selected as variables. The simplex optimization located the region of optimum sensitivity, and the partial factorial design ...
Martha S. Hendrick, Robert G. Michel
openaire   +1 more source

Investigation of wavelength calibration for an echelle cross-dispersion spectrometer

Journal of Analytical Atomic Spectrometry, 2003
The effects of ambient temperature and relative humidity on the positions of spectral lines on a two-dimensional focal plane were investigated. When environmental conditions change, a spectral line can move in both the horizontal (x) and vertical (y) directions.
Keling Liu, Gary M. Hieftje
openaire   +1 more source

GIANO: An Ultra-Stable IR Echelle Spectrometer for the TNG Telescope

2006
GIANO is an IR cross-dispersed echelle spectrometer designed to achieve high throughput, high resolving power, wide band coverage and high accuracy radial velocity measurements. It also includes polarimetric capabilities and a low resolution mode that make it a very versatile, common user instrument which will be permanently mounted and available at ...
OLIVA E, ORIGLIA L, MAIOLINO R, GENNARI S, BILIOTTI V, ROSSETTI E, BAFFA C, LEONE, Francesco, MONTEGRIFFO P, LOLLI M, D'AMATO F, BRUNO P, SCUDERI S, GHINASSI F, GONZALEZ M, LODI M, FALCINI G, GIANI E, MARCUCCI G, SOZZI M.   +19 more
openaire   +2 more sources

The Multi-Echelle Grating Arrangement (Mega) Spectrometer

SPIE Proceedings, 1984
A spectrometer system, based on the Multi-Echelle Grating Arrangement (MEGA) (1) has been developed. Through series diffraction in an even number of echelle gratings, high dispersion and spectral resolutions are obtained. It can be shown (1) that with n gratings of width W, utilized in a MEGA-spectrometer of focal length f, the same resolution and ...
openaire   +1 more source

The performance of a large echelle grating in a solar spectrometer

Solar Physics, 1967
A number of tests of a large diffraction grating are described. It is shown that useful information about the performance of the grating in a spectrometer can be obtained from an analysis of the diffracted wavefront by the method of Stroke. Comparison of the instrumental profile at three wavelengths strongly suggests that the influence of changes in ...
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Echelle Grating Spectrometers in Analytical Spectrometry

Analytical Chemistry, 1976
Peter N. Keliher, Charles C. Wohlers
openaire   +1 more source