Results 271 to 280 of about 137,622 (316)
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Computer, 2015
edX CEO Anant Agarwal discusses what the online learning provider has achieved in its first three years and where it's heading. The first Web extra at https://youtu.be/tgluUdmQTXM is a video in which edX CEO Anant Agarwal talks with Charles Severance about what the online learning provider has achieved in its first three years and where it's heading ...
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edX CEO Anant Agarwal discusses what the online learning provider has achieved in its first three years and where it's heading. The first Web extra at https://youtu.be/tgluUdmQTXM is a video in which edX CEO Anant Agarwal talks with Charles Severance about what the online learning provider has achieved in its first three years and where it's heading ...
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Democracy in Education: The Case of edX
2016The online learning platform edX is the result of Harvard University’s and MIT’s dedicated efforts to globally democratize education. In 2012, when edX was launched, a number of other massive open online course (MOOC) providers started to operate, such as Coursera or Udacity, making edX part of a group of innovators in the MOOC domain. From the outset,
Kai-Ingo Voigt +2 more
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CAS 2011 Proceedings (2011 International Semiconductor Conference), 2011
We present the results of a structural and compositional investigation of Al-doped thin films obtained by sol-gel deposition on Si/SiO 2 substrates. Taking into consideration the layer by layer deposition process and that the films contain 1–10 successive layers, the evolution of structure and elemental composition, especially Al concentration in the ...
E. Vasile +3 more
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We present the results of a structural and compositional investigation of Al-doped thin films obtained by sol-gel deposition on Si/SiO 2 substrates. Taking into consideration the layer by layer deposition process and that the films contain 1–10 successive layers, the evolution of structure and elemental composition, especially Al concentration in the ...
E. Vasile +3 more
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Ultrastructural element localization by EDXS in Empetrum nigrum
Micron, 2002Empetrum nigrum L. is one of the few species growing on highly polluted areas in the northern boreal forests and it accumulates considerable amounts of heavy metals especially in its older stems. Previous-year stems of Empetrum nigrum were collected from two different sites located at distances of 0.5km (highly contaminated) and 8km (low contaminated ...
Satu, Monni +2 more
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Advanced EDX Analysis for Memory Devices
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2020Energy Dispersive X-ray (EDX) is a commonly used tool for elemental analysis in failure analysis for years. EDX tool can perform qualitative and quantitative elemental analysis to identify various chemical elements and characterize the material properties.
Lai-Seng Yeoh +3 more
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Multi-Modal Peer Discussion with RichReview on edX
Adjunct Proceedings of the 28th Annual ACM Symposium on User Interface Software & Technology, 2015In this demo, we present RichReview, a multi-modal peer discussion system, implemented as an XBlock in the edX courseware platform. The system brings richness similar to face-to-face communication into online learning at scale. With this demonstration, we discuss the system?s scalable back-end architecture, semantic voice editing user interface, and a ...
Dongwook Yoon, Piotr Mitros
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Prospects for improvement in EDX microanalysis
Journal of Microscopy, 1983SUMMARYThere is still considerable room for improvement in the EDX technique, particularly for the analysis of thin samples in transmission electron microscopes. Further research is required to characterize changes which are introduced during specimen preparation and a technique for mass thickness determination has to be established which is both ...
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Ultramicroscopy, 1989
Abstract Experiments have been carried out in which the influence of beam broadening on the spatial resolution of X-ray analytical data has been assessed at 200 and at 400 kV. It has been found that any improvement at the higher voltage becomes significant only at sample thickness which are greater than those that would be used for microanalysis, i.e.
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Abstract Experiments have been carried out in which the influence of beam broadening on the spatial resolution of X-ray analytical data has been assessed at 200 and at 400 kV. It has been found that any improvement at the higher voltage becomes significant only at sample thickness which are greater than those that would be used for microanalysis, i.e.
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EDXS in the electron microscope: The hardware
Proceedings, annual meeting, Electron Microscopy Society of America, 1994The hardware employed for microanalysis by energy-dispersive x-ray analysis in the electron microscope consists, logically enough, of two principal parts, i.e. the electron microscope and the x-ray detector/analyzer combination. There are a number of excellent sources which discuss in depth how these work and interact to allow an analysis to be ...
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