Results 111 to 120 of about 8,831 (230)

Nanometer scale x-ray absorption spectroscopy and chemical states mapping of ultra thin oxides on silicon using electrostatic force microscopy

, 2007
Electrostatic force microscopy (EFM) was used to obtain highly spatially resolved spectroscopic and image information of semiconductor surface region. EFM with x-ray source (X-EFM) can probe x-ray induced photoionization of near surface electron trapping.
M. Ishii, B. Hamilton, De Gendt, S., N. R. J. Poolton, Ishii, M., S. De Gendt, Rigopoulos, N., Poolton, N. R J, N. Rigopoulos, K. Sakurai, Hamilton, B., Sakurai, K.   +11 more
core   +1 more source

Structural and Electrical Characterization of Hf0.5Zr0.5O2 Thin Films Crystallized by Rapid Thermal Annealing [PDF]

BIO Web of Conferences
Park Jucheol, Park Yeong Gyeong, Kang Min-Ho, Lee Myung-Keun, Hyun Moon Seop   +4 more
doaj   +1 more source

Aplicación de la técnica de modulación de frecuencia electroquímica (EFM) para mediciones de corrosión en concretos

, 2009
Se presenta la técnica Modulación de Frecuencia Electroquímica (EFM), como un nuevo método para la evaluación de la velocidad de corrosión y análisis electroquímico de materiales.
Fernández Naranjo, Orlando, Mejía de Gutiérrez, Ruby, Ortiz, Cesar Armando, Mora Parada, José Manuel, Aperador Chaparro, William Arnulfo   +4 more
core  

The Quantitative Study of Trapped Charges in Nano-Scale Ge Islands probed by EFM Measurement

, 2010
In this work, an individual Ge island on top of silicon dioxide layer has been charged by a conductive EFM tip and quantitatively characterized at room temperature.
Zhen Lin, Pavel Brunkov, Franck Bassani, Georges Bremond   +3 more
core   +1 more source

Breaking the limits of functional Atomic Force Microscopy imaging using Focused Electron Beam Induced Deposition [PDF]

BIO Web of Conferences
Brugger-Hatzl Michele, Seewald Lukas, Winkler Robert, Kuhness David, Huth Michael, Barth Sven, Plank Harald   +6 more
doaj   +1 more source

Protective effect of Enterococcus faecium against ethanol-induced gastric injury via extracellular vesicles

Microbiology Spectrum
Recently, Enterococcus has been shown to have gastric protective functions, and the mechanisms by which Enterococcus modulates gastric function are still being investigated. Herein, we investigated how Enterococcus faecium (Efm) and E.
Meiying Luo, Junhang Sun, Suqian Li, Limin Wei, Ruiping Sun, Xin Feng, Huihua Zhang, Ting Chen, Qianyun Xi, Yongliang Zhang, Qien Qi   +10 more
doaj   +1 more source

Biomedical application and controlled drug release of electrospun fibrous materials

, 2018
Electrospinning, as a nanotechnology, is able to produce polymeric fibers materials with nanoscale structure which are also named electrospun fibers material (EFM).
Xiaoye Yang, Xin Che, Zhai, Guangxi, Che, Xin, Yang, Mingshi, Yang, Xiaoye, Guangxi Zhai, Cheng, Huiling, Mingshi Yang, Huiling Cheng   +9 more
core   +1 more source

An EMMS-based multi-fluid model (EFM) for heterogeneous gas-solid riser flows: Part I. Formulation of structure-dependent conservation equations

, 2012
In gas-solid riser flows, meso-scale structures have significant effects on the flow, mass/heat transfer as well as reaction behavior. To be consistent with these structures, this paper reformulates the Energy-Minimization Multi-Scale (EMMS) model in ...
Zhou, Quan, Wang, W, Li, Jinghai, Wang, Wei, Hong, Kun, Wang, Junwu   +5 more
core   +1 more source

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

Beilstein Journal of Nanotechnology
We present multifrequency heterodyne electrostatic force microscopy (MFH-EFM) as a novel electrostatic force microscopy method for nanoscale capacitance characterization at arbitrary frequencies above the second cantilever resonance.
Pascal N. Rohrbeck, Lukas D. Cavar, Franjo Weber, Peter G. Reichel, Mara Niebling, Stefan A. L. Weber   +5 more
doaj   +1 more source

Cross-Section AFM and EFM Examination of Thin-Film Solar Cells

, 2020
We demonstrated the feasibility of analyzing cross sections of thin-film CdTe/CdS and CIGS/CdS solar cells using atomic force microscopy (AFM). The AFM images were compared with images obtained with the scanning electron microscopy (SEM), and the ...
C Ballif, M M Al-Jassim, R G Dhere, K Ramanathan, H R Moutinho, L L Kazmerski, F S Hasoon   +6 more
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