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The electric field inside semiconductor devices is a key physical parameter that determines the properties of the devices. However, techniques based on scanning probe microscopy are limited to sensing at the surface only.
Takayuki Iwasaki +2 more
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ISFET-Based Sensing and Electric Field Actuation of DNA for On-Chip Detection: A Review
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A double variable control load sensing system for electric hydraulic excavator
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Electric field compensation and sensing with a single ion in a planar trap
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Pd/AlN/SiC thin-film devices for selective hydrogen sensing Available to Purchase
Applied Physics Letters, 2001Gregory Auner, Ratna Naik, L Rimai
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Optical sensing systems for microfluidic devices: A review
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