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Direct Nanoscale Sensing of the Internal Electric Field in Operating Semiconductor Devices Using Single Electron Spins

open access: yesACS Nano, 2017
The electric field inside semiconductor devices is a key physical parameter that determines the properties of the devices. However, techniques based on scanning probe microscopy are limited to sensing at the surface only.
Takayuki Iwasaki   +2 more
exaly   +2 more sources
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