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Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1994
exaly  

[History of the Electrical Overstress/Electrostatic Discharge Symposia 1979-2015]

2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015
openaire   +1 more source

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