Results 81 to 90 of about 11,456,839 (368)

Apparatus for measuring electrical properties of materials [PDF]

open access: yes, 1973
Resistance of sample is measured with aid of usual electrical test instruments applied to electrical contacts provided at ram and anvil assemblies. Temperature differential is established between ram and anvil for measurement of Seebeck coefficient ...
Hadek, V.
core   +1 more source

Influence of deep levels on the electrical transport properties of CdZnTeSe detectors

open access: yes, 2018
We investigated the influence of deep levels on the electrical transport properties of CdZnTeSe radiation detectors by comparing experimental data with numerical simulations based on simultaneous solution of drift-diffusion and Posisson equations ...
Dědič, V   +6 more
core   +1 more source

Mechanical, Electrical, and Magnetic Properties of Ni Nanocontacts [PDF]

open access: yes, 2008
The dynamic deformation upon stretching of Ni nanowires as those formed with mechanically controllable break junctions or with a scanning tunneling microscope is studied both experimentally and theoretically.
Calvo, M. R.   +4 more
core   +2 more sources

Hopfield Neural Networks for Online Constrained Parameter Estimation With Time‐Varying Dynamics and Disturbances

open access: yesInternational Journal of Adaptive Control and Signal Processing, EarlyView.
This paper proposes two projector‐based Hopfield neural network (HNN) estimators for online, constrained parameter estimation under time‐varying data, additive disturbances, and slowly drifting physical parameters. The first is a constraint‐aware HNN that enforces linear equalities and inequalities (via slack neurons) and continuously tracks the ...
Miguel Pedro Silva
wiley   +1 more source

Structural and electrical properties of CuAlMo thin films prepared by magnetron sputtering [PDF]

open access: yes, 2013
The structural and electrical properties of a low resistivity CuAlMo thin film resistor material were investigated. The thin films were grown on Al2O3 and glass substrates by direct current (dc) magnetron sputtering.
Bashev   +31 more
core   +1 more source

Current Tracking Adaptive Control of Brushless DC Motors

open access: yesInternational Journal of Adaptive Control and Signal Processing, EarlyView.
In this paper, the current tracking for Brushless Direct Current motors is approached considering uncertainty in the parameters of the motor's model. An adaptive control scheme to compensate electrical parameters uncertainty is proposed without requiring any knowledge of the mechanical parameters.
Fernanda Ramos‐García   +3 more
wiley   +1 more source

Electrical properties of ferromagnetic-insulator nanocomposites

open access: yesEPJ Web of Conferences, 2018
Analysis of experimental studying of electrical properties of ferromagnetic-insulator nanocomposites is presented in the paper.
Kalinin Yu.E.   +3 more
doaj   +1 more source

Electrical properties anisotype heterojunctions n-TiO2:Mn/p-CdTe [PDF]

open access: yesTekhnologiya i Konstruirovanie v Elektronnoi Apparature, 2013
The authors have investigated electronic properties of n-TiO2:Mn/p-CdTe anisotype heterojunctions, produced by the method of electron-beam evaporation of TiO2:Mn film on single-crystal CdTe substrates in vacuum. The dominant mechanism of charge transport
Mostovyi A. I.   +3 more
doaj   +2 more sources

Study of a Carbon Nanowall Synthesized on an MWCNT-Based Buffer Layer for Improvement of Electrical Properties

open access: yesApplied Sciences, 2019
We conducted experiments to improve the electrical properties of the CNW (carbon nanowall), which has lower electrical properties than other carbon allotropes such as graphene and CNT (carbon nanotube), and report the results through this article.
Joouk Kim   +6 more
doaj   +1 more source

I-V and C-V Characteristics of Porous Silicon Nanostructures by Electrochemical Etching [PDF]

open access: yesEngineering and Technology Journal, 2013
Porous silicon (PS) layers has been prepared in this work by electrochemical etching (ECE) technique of a p-type silicon wafer with resistivity (1.5-4 Ω.cm) in hydrofluoric (HF) acid of 20% concentration.
Fatima I. Sultan   +2 more
doaj   +1 more source

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