Results 1 to 10 of about 839,437 (238)

Combined Effect of TID Radiation and Electrical Stress on NMOSFETs [PDF]

open access: yesMicromachines, 2022
The combined effect of total ionizing dose (TID) and electrical stress is investigated on NMOSFETs. For devices bearing both radiation and electrical stress, the threshold voltage shift is smaller than those only bearing electrical stress, indicating ...
Yanrong Cao   +12 more
doaj   +2 more sources

Thermally Induced Mechanical Stress in the Stator Windings of Electrical Machines [PDF]

open access: yesEnergies, 2018
The lifetime of an electrical machine mainly depends on the thermal overloading. Modern day applications of electrical machines on one hand require compact machines with high power density, while on the other hand force electrical machines to undergo ...
Bishal Silwal, Peter Sergeant
doaj   +4 more sources

Acupuncture combined with biofeedback electrical stimulation for female stress urinary incontinence: a systematic review and meta-analysis [PDF]

open access: yesFrontiers in Medicine
IntroductionThis meta-analysis aimed to determine the clinical efficacy of acupuncture combined with biofeedback electrical stimulation for stress urinary incontinence in women.MethodsDatabases including CNKI, WanFang, VIP, PubMed, Cochrane Library ...
Hongji Liu   +3 more
doaj   +2 more sources

Abiotic stress triggers electrical synchronisation of shoot and leaves in soybean plants: a clue for plant attention-like [PDF]

open access: yesPlant Signaling & Behavior
Plants rely on sophisticated intercellular communication to coordinate systemic responses to environmental challenges. Electrical signals contribute for rapid, long-distance integration of plant parts.
Thiago Francisco de Carvalho Oliveira   +5 more
doaj   +2 more sources

Characteristics and Degradation Mechanisms under High Reverse Base–Collector Bias Stress in InGaAs/InP Double HBTs

open access: yesMicromachines, 2023
In this paper, the reliability of InP/InGaAs DHBTs under high reverse base–collector bias stress is analyzed by experiments and simulation. The DC characteristics and S parameters of the devices under different stress times were measured, and the key ...
Silu Yan   +5 more
doaj   +1 more source

Graphene–Silicon Diode for 2-D Heterostructure Electrical Failure Protection

open access: yesIEEE Journal of the Electron Devices Society, 2022
Two-dimensional materials have modernized a broad interest in electronic devices. Along with many advantages, their atomic-level thickness makes them sensitive under high electrical stress. This work proposes a protection design using a Graphene/Silicon (
Muhammad Abid Anwar   +12 more
doaj   +1 more source

The Insulation Resilience of Inverter-Fed Low Voltage Traction Machines: Review, Challenges, and Opportunities

open access: yesIEEE Access, 2022
The use of wide bandgap (WBG) semiconductor devices, which enable higher switching slew rates, and the increase in DC link voltage, which provides system-wide advantages, exposes the winding system of traction machines to enhanced electrical stress.
Timo Petri   +2 more
doaj   +1 more source

Electrical Stress on the Medium Voltage Medium Frequency Transformer

open access: yesEnergies, 2021
This paper proposes an equivalent circuit model to obtain the transient electrical stress quantitatively in medium voltage medium frequency transformers in modern power electronics.
Zheng Changjiang   +4 more
doaj   +1 more source

Study of Partial Discharge Inception Voltage in Inverter Fed Electric Motor Insulation Systems

open access: yesApplied Sciences, 2023
This article performs a thorough evaluation of different environmental and electrical waveform characteristics affecting PDIV on electric motor winding insulation. Temperature received special attention, as it clearly affects PDIV. Additionally, the PDIV
Leire Elorza Azpiazu   +4 more
doaj   +1 more source

The comparison of gamma-radiation and electrical stress influences on oxide and interface defects in power VDMOSFET [PDF]

open access: yesNuclear Technology and Radiation Protection, 2013
The behaviour of oxide and interface defects in n-channel power vertical double-diffused metal-oxide-semiconductor field-effect transistors, firstly degraded by the gamma-irradiation and electric field and subsequently recovered and annealed, is
Đorić-Veljković Snežana M.   +5 more
doaj   +1 more source

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