Results 51 to 60 of about 8,180,782 (248)

Development of an RF IV waveform based stress test procedure for use on GaN HFETs [PDF]

open access: yes, 2012
This paper reports on the development of an RF IV waveform based stress test procedure. DC and low-voltage RF characterisation was carried out before and after high power RF stress.
Tasker, Paul J.   +3 more
core   +1 more source

Research on Degradation Mechanism of Darlington Transistor Under Electrical and Thermal Stress

open access: yesIEEE Access
Aiming at the problem of investigating the degradation and failure mechanism of Darlington transistors under external stresses, the paper carries out research on the modeling and simulation of Darlington transistor. By comparing the electrical parameters
Changjun Li   +4 more
doaj   +1 more source

Natural Frequencies of Levodopa‐Induced Dyskinesia in Parkinson's Disease

open access: yesAnnals of Clinical and Translational Neurology, EarlyView.
ABSTRACT Objectives Abnormal involuntary movements, known as dyskinesias, are common complications of levodopa treatment in patients with Parkinson's disease and can significantly impair quality of life. The underlying pathophysiology remains unclear, and current therapeutic options are limited.
Ioannis U. Isaias   +3 more
wiley   +1 more source

Electrical Aging of the Insulation of Low Voltage Machines: Model definition and test with the Design of Experiments [PDF]

open access: yes, 2013
The aim of this paper is to present a method for modeling the lifespan of insulation materials in a partial discharge regime. Based on the design of experiments, it has many advantages: it reduces the number of time-consuming experiments, increases the ...
Nadine Lahoud   +7 more
core   +1 more source

Impact of Age on the Diagnostic Yield of Routine EEG in People With Childhood or Juvenile Absence Epilepsy: A Cross‐Sectional Study

open access: yesAnnals of Clinical and Translational Neurology, EarlyView.
ABSTRACT Background We aimed to identify the proportion of individuals with a confirmed diagnosis of childhood absence epilepsy (CAE) or juvenile absence epilepsy (JAE) who show a negative routine EEG (rEEG), and to determine the main factors associated with this finding.
Francesco Fortunato   +7 more
wiley   +1 more source

Electrical Stimulation for Urinary Incontinence in Women: A Systematic Review

open access: yesInternational Brazilian Journal of Urology, 2013
Background Electrical stimulation is commonly recommended to treat urinary incontinence in women. It includes several techniques that can be used to improve stress, urge, and mixed symptoms.
Lucas Schreiner   +4 more
doaj   +1 more source

dynoGP: Deep Gaussian Processes for Dynamic System Identification

open access: yesInternational Journal of Adaptive Control and Signal Processing, EarlyView.
This work introduces a novel class of deep models for system identification, dynamical deep Gaussian processes, which combine the strengths of data‐driven methods, such as those based on neural network architectures, with the ability to output a probability distribution for uncertainty representation.
Alessio Benavoli   +3 more
wiley   +1 more source

The characteristics of electrical trees in the inner and outer layers of different voltage rating XLPE cable insulation

open access: yes, 2009
The statistical initiation and propagation characteristics of electrical trees in cross-linked polyethylene (XLPE) cables with different voltage ratings from 66 to 500 kV were investigated under a constant test voltage of 50 Hz/7 kV (the 66 kV rating ...
Li, Shengtao   +3 more
core   +1 more source

Electrical vagus nerve stimulation attenuates systemic inflammation and improves survival in a rat heatstroke model. [PDF]

open access: yesPLoS ONE, 2013
This study was performed to gain insights into novel therapeutic approaches for the treatment of heatstroke. The central nervous system regulates peripheral immune responses via the vagus nerve, the primary neural component of the cholinergic anti ...
Kazuma Yamakawa   +9 more
doaj   +1 more source

The Breakdown of Cell Membranes by Electrical and Mechanical Stress [PDF]

open access: yesBiophysical Journal, 1998
We attempted to determine whether mechanical tension and electrical stress couple to cause membrane breakdown in cells. Using cell-attached patches from HEK293 cells, we estimated the mechanically produced tension from the applied pressure and geometry of the patch. Voltage pulses of increasing amplitude were applied until we observed a sudden increase
Akinlaja, Johannes, Sachs, Frederick
openaire   +2 more sources

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