Electro-thermal coupling simulation of high power bipolar transistors
[1987] NASECODE V: Proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, 1987It is shown that a numerical iterative coupling process between an electrical model of high power bipolar transistors and a three-dimensional thermal model (based on the thermal influence coefficient method) of the transistor and its case well predicts the onset of an electro-thermal instability in this kind of devices.
A. Napieralski, J.M. Dorkel, P. Leturcq
openaire +1 more source
Fully coupled electro-thermal simulation of a micro pirani gauge
2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, 2010In this paper, fully coupled electro-thermal simulation of a micro pirani gauge is presented. The simulation was carried out using CFD-ACE+ software, based on Finite Volume Method (FVM) for multi-disciplinary modeling. Temperature coefficient of resistance (TCR) of silicon was taken into account for solving the joule heating and heat transfer equations.
null Wei Jiang +4 more
openaire +1 more source
Parametric Model Order Reduction for Electro-Thermal Coupled Problems
2019We consider automatic parametric model order reduction for electro-thermal (ET) coupled problems arising from (nano-)microelectronic simulations. We show that the PMOR method based on multi-moment matching proposed in [2] can be applied to the discretized ET models. The error bound in [6] is used to check the accuracy of the reduced models.
Feng, L. +1 more
openaire +2 more sources
Optimal Charging of Li-Ion Batteries With Coupled Electro-Thermal-Aging Dynamics
IEEE Transactions on Vehicular Technology, 2017Fast and safe charging protocols are crucial for enhancing the practicality of batteries, especially for mobile applications, such as smartphones and electric vehicles. This paper proposes an innovative approach to devising optimally health-conscious fast-safe charge protocols. A multiobjective optimal control problem is mathematically formulated via a
Hector Eduardo Perez +3 more
openaire +1 more source
Electro-Thermally Coupled Power Optimization for Future Transistors and Its Applications
IEEE Transactions on Electron Devices, 2007We report a novel electro-thermally coupled power-optimization methodology for future transistors. The methodology self-consistently yields the globally optimized total power and the corresponding temperature as a function of delay for a given set of transistors (bulk, double-gate FET, fully depleted SOI, and partially depleted SOI) at future ...
Andy Kuo-An Chao +4 more
openaire +1 more source
Coupled electro-thermal Simulations of single event burnout in power diodes
IEEE Transactions on Nuclear Science, 2005Power diodes may undergo destructive failures when they are struck by high-energy particles during the off state (high reverse-bias voltage). This paper describes the failure mechanism using a coupled electro-thermal model. The specific case of a 3500-V diode is considered and it is shown that the temperatures reached when high voltages are applied are
A.M. Albadri +3 more
openaire +1 more source
Three dimemsional electro-thermal coupled Monte Carlo device simulation
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 20143D paralleled electro-thermal coupled full band ensemble MC simulation platform is developed for analysis of local heating effect on performance and reliability of semiconductor devices. This new developed simulation platform provides a powerful tool for thermal-aware device and circuit design of nano scale devices.
Xiaoyan Liu +7 more
openaire +1 more source
Partially coupled electro-thermal analysis for accurate prediction of switching devices
Canadian Conference on Electrical and Computer Engineering 2001. Conference Proceedings (Cat. No.01TH8555), 2002Power hybrid assemblies including IGBT (insulated gate bipolar transistor) are widely used in the application of motor drivers, switching supplies and other power conversion systems. The estimation of the power loss and junction temperature of semiconductor devices has become the major issue with the increase of the current density and high switching ...
A. Lakhsasi, Y. Hamri, A. Skorek
openaire +1 more source
Coupled-domain nonlinear macromodels and pull-in characteristics with electro-thermal effect
TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664), 2004In this paper, we describe an efficient coupled-domain nonlinear macromodeling method for microsystems, and present the study of electro-thermal effects on the pull-in characteristic for a fixed-fixed beam by using this approach. The macromodeling method applies both the Karhunen-Loeve/Galerkin technique and the Arnoldi technique.
Cheng, Szu-Yuan +2 more
openaire +2 more sources
Coupled Electro-Thermal Battery Emulator for Power Systems Testing
Hybrid power systems that combine fossil fuel generators with an electrical microgrid are more efficient and practical for automotive, naval, and aviation industries. This paper demonstrates an electro-thermal battery emulator to aid during design and initial testing phases of electrified systems.Jarrett Peskar +4 more
openaire +1 more source

