Results 231 to 240 of about 116,797 (291)
Experimentally separating vacuum fluctuations from source radiation. [PDF]
Herter A +4 more
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Electro-Chemo-Mechanical Coupling in Composite Cathodes of Sulfide-Based All-Solid-State Batteries: Pathways, Degradation, and Design Rules. [PDF]
Song G, Lee S, Lee M, Park J, Lee KT.
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Integrated optomechanical ultrasonic sensors with nano-Pascal-level sensitivity. [PDF]
Cao X +11 more
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Recent Advances in the High-Value Conversion of Alkenes Induced by Electrochemistry. [PDF]
Liang X, Wang H, Xie W, Liu Z, Qin D.
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Multiphysics Phase-Field Modeling of Corrosion-Induced Degradation in Unsaturated Reinforced Concrete Structure. [PDF]
Lu A, Zhang Y.
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Electro‐Thermal Coupling Catalysis
Angewandte Chemie - International EditionAbstract The chemical industry serves as a cornerstone of modern societal development, yet it is also associated with substantial energy consumption and high emissions. Electro‐thermal coupling catalysis, an emerging frontier at the intersection of thermocatalysis and electrocatalysis, offers a promising solution.
Guoxiong Wang
exaly +2 more sources
Electro-thermal coupling model of supercapacitor for online application
2019 IEEE 4th International Future Energy Electronics Conference (IFEEC), 2019Online temperature observation is very important for the health diagnosis and safe operation of the supercapacitor energy storage system. The paper presents an electro-thermal coupling model to estimate the temperature in supercapacitor. Firstly, an electro-thermal coupling model is built for the purpose of online temperature observation.
Li Wei
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Coupled Electro-Thermal Simulation of MOSFETs
ASME 2009 InterPACK Conference, Volume 1, 2009Thermal transport in metal-oxide-semiconductor field effect transistors (MOSFETs) due to electron-phonon scattering is simulated using phonon generation rates obtained from an electron Monte Carlo device simulation. The device simulation accounts for a full band description of both electrons and phonons considering 22 types of electron-phonon ...
Chunjian Ni +3 more
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Fully coupled dynamic electro-thermal simulation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1997Fully coupled dynamic electro-thermal simulation on chip and circuit level is presented. Temperature dependent thermal conductivity of silicon is taken into account, thus solving the nonlinear heat diffusion equation. The numerical solution is carried out by using the industry-standard simulator SABER, therefore for electro-thermal simulations we are ...
G. Digele, S. Lindenkreuz, E. Kasper
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