Results 221 to 230 of about 11,497 (259)

Coupled Electro-Thermal-Phase Change Modeling of a Chalcogenide Switch

Heat Transfer, Volume 3, 2006
A coupled electro-thermal-phase change numerical model is developed to model the threshold and memory switching processes in a chalcogenide switch based on phase change memory (PCM) technology. Coupled electrical and thermal transport coupled to phase change and crystallization kinetics are solved. Charge transport has been implemented using simplified
Navdeep Singh Dhillon, Jayathi Y. Murthy
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Coupled Electro-Thermal Mechanical Analyses for SMM Actuators Development

Microelectromechanical Systems, 2004
A coupled-physics analysis code has been developed to simulate the electrical, thermal, and mechanical responses of surface micromachined (SMM) actuators. Our objective is to optimize the design and performance of these micro actuators. Since many new designs of these electro-thermal actuators have shuttles or platforms between beams, calculating the ...
C. Channy Wong, Randy R. Lober, Jason D. Hales   +2 more
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Package Reliability Analysis with Coupled Electro-Thermal and Mechanical Modeling

MRS Proceedings, 2013
ABSTRACTPower consumption and dissipation during electrical operation lead to a temperature rise in the package. Elevated temperature in the package structure induces thermo-mechanical stresses which may increase reliability risks. Robust and reliable package design for power systems requires comprehensive analysis of system electrical, thermal, and ...
Chan-Su Yun, Xiaopeng Xu, Arsen Terterian, Tommaso Cilento   +3 more
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Electro-thermal coupling simulation of high power bipolar transistors

[1987] NASECODE V: Proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, 1987
It is shown that a numerical iterative coupling process between an electrical model of high power bipolar transistors and a three-dimensional thermal model (based on the thermal influence coefficient method) of the transistor and its case well predicts the onset of an electro-thermal instability in this kind of devices.
A. Napieralski, J.M. Dorkel, P. Leturcq
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Fully coupled electro-thermal simulation of a micro pirani gauge

2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, 2010
In this paper, fully coupled electro-thermal simulation of a micro pirani gauge is presented. The simulation was carried out using CFD-ACE+ software, based on Finite Volume Method (FVM) for multi-disciplinary modeling. Temperature coefficient of resistance (TCR) of silicon was taken into account for solving the joule heating and heat transfer equations.
null Wei Jiang, null Jilong Zhou, null Xin Wang, null Long Wang, null Jinwen Zhang   +4 more
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Parametric Model Order Reduction for Electro-Thermal Coupled Problems

2019
We consider automatic parametric model order reduction for electro-thermal (ET) coupled problems arising from (nano-)microelectronic simulations. We show that the PMOR method based on multi-moment matching proposed in [2] can be applied to the discretized ET models. The error bound in [6] is used to check the accuracy of the reduced models.
Feng, L., Benner, P. ; https://orcid.org/0000-0003-3362-4103   +1 more
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Optimal Charging of Li-Ion Batteries With Coupled Electro-Thermal-Aging Dynamics

IEEE Transactions on Vehicular Technology, 2017
Fast and safe charging protocols are crucial for enhancing the practicality of batteries, especially for mobile applications, such as smartphones and electric vehicles. This paper proposes an innovative approach to devising optimally health-conscious fast-safe charge protocols. A multiobjective optimal control problem is mathematically formulated via a
Hector Eduardo Perez, Xiaosong Hu, Satadru Dey, Scott J. Moura   +3 more
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Electro-Thermally Coupled Power Optimization for Future Transistors and Its Applications

IEEE Transactions on Electron Devices, 2007
We report a novel electro-thermally coupled power-optimization methodology for future transistors. The methodology self-consistently yields the globally optimized total power and the corresponding temperature as a function of delay for a given set of transistors (bulk, double-gate FET, fully depleted SOI, and partially depleted SOI) at future ...
Andy Kuo-An Chao, Pawan Kapur, Eiji Morifuji, Krishna Saraswat, Yoshio Nishi   +4 more
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Coupled electro-thermal Simulations of single event burnout in power diodes

IEEE Transactions on Nuclear Science, 2005
Power diodes may undergo destructive failures when they are struck by high-energy particles during the off state (high reverse-bias voltage). This paper describes the failure mechanism using a coupled electro-thermal model. The specific case of a 3500-V diode is considered and it is shown that the temperatures reached when high voltages are applied are
A.M. Albadri, R.D. Schrimpf, D.G. Walker, S.V. Mahajan   +3 more
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Three dimemsional electro-thermal coupled Monte Carlo device simulation

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2014
3D paralleled electro-thermal coupled full band ensemble MC simulation platform is developed for analysis of local heating effect on performance and reliability of semiconductor devices. This new developed simulation platform provides a powerful tool for thermal-aware device and circuit design of nano scale devices.
Xiaoyan Liu, Kangliang Wei, Longxiang Yin, Gang Du, Hai Jiang, Kai Zhao, Lang Zeng, Xing Zhang   +7 more
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