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A Study on Electroluminescent Phenomenon for Solar Cells Test
2018 1st IEEE International Conference on Knowledge Innovation and Invention (ICKII), 2018Solar power is widely used in many industries and focus on studying on how to make a solar electrical power with the higher transfer efficiency and higher operating stability. There are various types of solar cell defects in fabrication and operation. Various defects of solar cell might lower the photoelectron transformation efficiency.
Chia-Chun Wu, Yu-Cherng Hung
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Electroluminescence image analysis of a photovoltaic module under accelerated lifecycle testing
Applied Optics, 2020Electroluminescence (EL) imaging of Si-based photovoltaic (PV) modules is used widely to spatially detect and characterize electrical defects, including handling and degradation-induced cracking of the component Si cells that are associated with reductions in module performance.
Teh, Lai +2 more
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A Testing Device for Thin Film Electroluminescent Indicators
2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE), 2018Elements of a display are an important part of information systems. Necessary to study parameters of materials and designs. To create new samples of indicators and control the quality. This problem required an integrated approach. Therefore the development of an automated device for testing thin film electroluminescent indicators is an important task ...
O.V. Maksimova, P.V. Nikolaev
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Optical testing methods for organic electroluminescent displays
Synthetic Metals, 1997Abstract Several academic and industrial organizations are developing displays based on organic electroluminescent (OEL) materials. Once the functional capabilities and expected lifetimes of organic displays are firmly established, OEL technology can be used to improve human interfaces in products such as hand-held terminals.
G.E. Carver, V.J. Velasco
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Solar RRL, 2023
Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini‐modules (MA0.6FA0.4PbI3, 20 cells, 78 cm2) before and after indoor‐accelerated stress testing or outdoor deployment.
Jackson W. Schall +11 more
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Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini‐modules (MA0.6FA0.4PbI3, 20 cells, 78 cm2) before and after indoor‐accelerated stress testing or outdoor deployment.
Jackson W. Schall +11 more
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Electroluminescence-Testing Induced Crack Closure in PV Modules
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 2019Electroluminescence (EL) measurements of PV modules with cracked cells have showed some open cracks to close arbitrarily from day to day even though these modules are stored in a controlled, stressor free laboratory environment – constant temperature and no mechanical load.
Seigneur, Hubert +3 more
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CPV solar receiver ageing tests: The enhanced electroluminescence method
AIP Conference Proceedings, 2013For two years now, CEA INES is involved in the development of insulated metal substrates (IMS) for CPV receivers. In an effort for establishing the reliability of such a new design compared to state-of-the-art direct bonded copper (DBC) design, accelerated ageing test have been carried out.
Loïc Mabille +2 more
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Electroluminescence technique to evaluate the effect of impulse tests on high voltage cables
IEEE Transactions on Dielectrics and Electrical Insulation, 1998EL (electroluminescence) in XLPE (crosslinked polyethylene) subjected to impulses of various amplitudes, shapes and repetition rates has been investigated. Defects that could occur in the polymeric insulation of underground HV cables were simulated by embedding semicon protrusions in XLPE to create highly divergent electric fields.
Bamji, S. S. +2 more
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Conference Record of the 2004 IEEE International Symposium on Electrical Insulation, 2005
The electroluminescence test is a relatively new technique to investigate the dielectric performance of semiconductive shields and crosslinked polyethylene insulation interfaces. It is based on the electric field (voltage) at which light emission occurs as a result of charge injection and carriers recombination for a given sample geometry.
S.J. Han, L.H. Gross
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The electroluminescence test is a relatively new technique to investigate the dielectric performance of semiconductive shields and crosslinked polyethylene insulation interfaces. It is based on the electric field (voltage) at which light emission occurs as a result of charge injection and carriers recombination for a given sample geometry.
S.J. Han, L.H. Gross
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