Results 161 to 170 of about 1,986 (212)

Optical testing methods for organic electroluminescent displays

Synthetic Metals, 1997
Abstract Several academic and industrial organizations are developing displays based on organic electroluminescent (OEL) materials. Once the functional capabilities and expected lifetimes of organic displays are firmly established, OEL technology can be used to improve human interfaces in products such as hand-held terminals.
G.E. Carver, V.J. Velasco
openaire   +1 more source

Accelerated Stress Testing of Perovskite Photovoltaic Modules: Differentiating Degradation Modes with Electroluminescence Imaging

Solar RRL, 2023
Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini‐modules (MA 0.6 FA 0.4 PbI 3 , 20 cells, 78 cm 2
Jackson W. Schall, Andrew Glaws, Nutifafa Y. Doumon, Timothy J. Silverman, Michael Owen-Bellini, Kent Terwilliger, Md Aslam Uddin, Prem Rana, Joseph J. Berry, Jinsong Huang, Laura T. Schelhas, Dana B. Kern   +11 more
openaire   +1 more source

Electroluminescence-Testing Induced Crack Closure in PV Modules

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 2019
Electroluminescence (EL) measurements of PV modules with cracked cells have showed some open cracks to close arbitrarily from day to day even though these modules are stored in a controlled, stressor free laboratory environment – constant temperature and no mechanical load.
Seigneur, Hubert, Gabor, Andrew M., Schneller, Eric, Lincoln, Jason   +3 more
openaire   +2 more sources

CPV solar receiver ageing tests: The enhanced electroluminescence method

AIP Conference Proceedings, 2013
For two years now, CEA INES is involved in the development of insulated metal substrates (IMS) for CPV receivers. In an effort for establishing the reliability of such a new design compared to state-of-the-art direct bonded copper (DBC) design, accelerated ageing test have been carried out.
Loïc Mabille, Christophe Mangeant, Mathieu Baudrit   +2 more
openaire   +1 more source

Electroluminescence technique to evaluate the effect of impulse tests on high voltage cables

IEEE Transactions on Dielectrics and Electrical Insulation, 1998
EL (electroluminescence) in XLPE (crosslinked polyethylene) subjected to impulses of various amplitudes, shapes and repetition rates has been investigated. Defects that could occur in the polymeric insulation of underground HV cables were simulated by embedding semicon protrusions in XLPE to create highly divergent electric fields.
Bamji, S. S., Kaufhold, M., Bulinski, A. T.   +2 more
openaire   +2 more sources

Electroluminescence test to evaluate dielectric property at the interface between semiconductive shield and insulation

Conference Record of the 2004 IEEE International Symposium on Electrical Insulation, 2005
The electroluminescence test is a relatively new technique to investigate the dielectric performance of semiconductive shields and crosslinked polyethylene insulation interfaces. It is based on the electric field (voltage) at which light emission occurs as a result of charge injection and carriers recombination for a given sample geometry.
S.J. Han, L.H. Gross
openaire   +1 more source

Light‐ and elevated temperature‐induced degradation impact on bifacial modules using accelerated aging tests, electroluminescence, and photovoltaic plant modeling

Progress in Photovoltaics: Research and Applications, 2020
AbstractThe authors report on the light‐ and elevated temperature‐induced degradation (LeTID) effect observed on bifacial photovoltaic modules and its potential impact on photovoltaic plants performance. Indoor LeTID quantification using indoor carrier‐induced degradation (CID) is carried out using current injection.
Julien Dupuis, Gilles Plessis, Gilbert El Hajje, Eric Lajoie‐Mazenc, Eric Sandré, Khalid Radouane, Patrick Dupeyrat   +6 more
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LeTID Impact on Bifacial Modules Using Accelerated Aging Tests, Electroluminescence and PV Plant Modelling

2020
The authors report on the Light and elevated Temperature Induced Degradation effect (LeTID) observed on bifacial photovoltaic modules and its potential impact on photovoltaic plants performance. Indoor LeTID quantification using indoor Carrier Induced Degradation (CID) is carried out using current injection.
Dupuis, J., Plessis, G., El Hajje, G., Lajoie-Mazenc, E., Sandré, E., Radouane, K., Dupeyrat, P.   +6 more
openaire   +1 more source

Utilization of electroluminescence from avalanche p-n junctions for optical testing of silicon integrated circuits

Proceedings., Eighth University/Government/Industry Microelectronics Symposium, 2003
The most appealing technique for contactless testing of the integrated circuit die has been determined to be through the use of optical signals in the visible or infrared region to supply test signals to and from the integrated circuit chip. The generation of light in silicon for the purpose of producing the output optical signal is difficult. Silicon,
S.K. Kurinec, M.A. Powell, L.F. Fuller, D.V. Kerns, K. Arora   +4 more
openaire   +1 more source

dc electroluminescence in copper-free Zns:Mn thin films. I. Local destructive breakdown and its dependence on preparation and test conditions

Journal of Applied Physics, 1987
The proportion of random localized destructive breakdown to stable electroluminescence has been varied continuously by adjusting (1) the recipe used to fabricate dc thin-film electroluminescent devices and (2) the conditions under which they have been tested.
J. M. Blackmore, A. F. Cattell, K. F. Dexter, J. Kirton, P. Lloyd   +4 more
openaire   +1 more source