Results 181 to 190 of about 2,168 (231)

Filtered Cathodic Vacuum Arc Deposition for Inkjet-Printed OLED Encapsulation. [PDF]

Materials (Basel)
Gao Z, Li S, Wang L, Chen L, Sun X, Fu D.   +5 more
europepmc   +1 more source

Photovoltaic Module Degradation Detection Using V-P Curve Derivatives and LSTM-Based Classification. [PDF]

Sensors (Basel)
Lee CH, Lim SK, Park SJ, Kim BH.
europepmc   +1 more source

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Optical testing methods for organic electroluminescent displays

Synthetic Metals, 1997
Abstract Several academic and industrial organizations are developing displays based on organic electroluminescent (OEL) materials. Once the functional capabilities and expected lifetimes of organic displays are firmly established, OEL technology can be used to improve human interfaces in products such as hand-held terminals.
G.E. Carver, V.J. Velasco
openaire   +1 more source

A Study on Electroluminescent Phenomenon for Solar Cells Test

2018 1st IEEE International Conference on Knowledge Innovation and Invention (ICKII), 2018
Solar power is widely used in many industries and focus on studying on how to make a solar electrical power with the higher transfer efficiency and higher operating stability. There are various types of solar cell defects in fabrication and operation. Various defects of solar cell might lower the photoelectron transformation efficiency.
Chia-Chun Wu, Yu-Cherng Hung
openaire   +1 more source

Accelerated Stress Testing of Perovskite Photovoltaic Modules: Differentiating Degradation Modes with Electroluminescence Imaging

Solar RRL, 2023
Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini‐modules (MA0.6FA0.4PbI3, 20 cells, 78 cm2) before and after indoor‐accelerated stress testing or outdoor deployment.
Jackson W. Schall, Andrew Glaws, Nutifafa Y. Doumon, Timothy J. Silverman, Michael Owen-Bellini, Kent Terwilliger, Md Aslam Uddin, Prem Rana, Joseph J. Berry, Jinsong Huang, Laura T. Schelhas, Dana B. Kern   +11 more
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Electroluminescence-Testing Induced Crack Closure in PV Modules

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 2019
Electroluminescence (EL) measurements of PV modules with cracked cells have showed some open cracks to close arbitrarily from day to day even though these modules are stored in a controlled, stressor free laboratory environment – constant temperature and no mechanical load.
Seigneur, Hubert, Gabor, Andrew M., Schneller, Eric, Lincoln, Jason   +3 more
openaire   +2 more sources

A Testing Device for Thin Film Electroluminescent Indicators

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE), 2018
Elements of a display are an important part of information systems. Necessary to study parameters of materials and designs. To create new samples of indicators and control the quality. This problem required an integrated approach. Therefore the development of an automated device for testing thin film electroluminescent indicators is an important task ...
O.V. Maksimova, P.V. Nikolaev
openaire   +1 more source

CPV solar receiver ageing tests: The enhanced electroluminescence method

AIP Conference Proceedings, 2013
For two years now, CEA INES is involved in the development of insulated metal substrates (IMS) for CPV receivers. In an effort for establishing the reliability of such a new design compared to state-of-the-art direct bonded copper (DBC) design, accelerated ageing test have been carried out.
Loïc Mabille, Christophe Mangeant, Mathieu Baudrit   +2 more
openaire   +1 more source

Electroluminescence technique to evaluate the effect of impulse tests on high voltage cables

IEEE Transactions on Dielectrics and Electrical Insulation, 1998
EL (electroluminescence) in XLPE (crosslinked polyethylene) subjected to impulses of various amplitudes, shapes and repetition rates has been investigated. Defects that could occur in the polymeric insulation of underground HV cables were simulated by embedding semicon protrusions in XLPE to create highly divergent electric fields.
Bamji, S. S., Kaufhold, M., Bulinski, A. T.   +2 more
openaire   +2 more sources