Results 191 to 200 of about 2,168 (231)
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Conference Record of the 2004 IEEE International Symposium on Electrical Insulation, 2005
The electroluminescence test is a relatively new technique to investigate the dielectric performance of semiconductive shields and crosslinked polyethylene insulation interfaces. It is based on the electric field (voltage) at which light emission occurs as a result of charge injection and carriers recombination for a given sample geometry.
S.J. Han, L.H. Gross
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The electroluminescence test is a relatively new technique to investigate the dielectric performance of semiconductive shields and crosslinked polyethylene insulation interfaces. It is based on the electric field (voltage) at which light emission occurs as a result of charge injection and carriers recombination for a given sample geometry.
S.J. Han, L.H. Gross
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Progress in Photovoltaics: Research and Applications, 2020
AbstractThe authors report on the light‐ and elevated temperature‐induced degradation (LeTID) effect observed on bifacial photovoltaic modules and its potential impact on photovoltaic plants performance. Indoor LeTID quantification using indoor carrier‐induced degradation (CID) is carried out using current injection.
Julien Dupuis +6 more
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AbstractThe authors report on the light‐ and elevated temperature‐induced degradation (LeTID) effect observed on bifacial photovoltaic modules and its potential impact on photovoltaic plants performance. Indoor LeTID quantification using indoor carrier‐induced degradation (CID) is carried out using current injection.
Julien Dupuis +6 more
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Proceedings., Eighth University/Government/Industry Microelectronics Symposium, 2003
The most appealing technique for contactless testing of the integrated circuit die has been determined to be through the use of optical signals in the visible or infrared region to supply test signals to and from the integrated circuit chip. The generation of light in silicon for the purpose of producing the output optical signal is difficult. Silicon,
S.K. Kurinec +4 more
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The most appealing technique for contactless testing of the integrated circuit die has been determined to be through the use of optical signals in the visible or infrared region to supply test signals to and from the integrated circuit chip. The generation of light in silicon for the purpose of producing the output optical signal is difficult. Silicon,
S.K. Kurinec +4 more
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2020
The authors report on the Light and elevated Temperature Induced Degradation effect (LeTID) observed on bifacial photovoltaic modules and its potential impact on photovoltaic plants performance. Indoor LeTID quantification using indoor Carrier Induced Degradation (CID) is carried out using current injection.
Dupuis, J. +6 more
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The authors report on the Light and elevated Temperature Induced Degradation effect (LeTID) observed on bifacial photovoltaic modules and its potential impact on photovoltaic plants performance. Indoor LeTID quantification using indoor Carrier Induced Degradation (CID) is carried out using current injection.
Dupuis, J. +6 more
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Journal of Applied Physics, 1987
The proportion of random localized destructive breakdown to stable electroluminescence has been varied continuously by adjusting (1) the recipe used to fabricate dc thin-film electroluminescent devices and (2) the conditions under which they have been tested.
J. M. Blackmore +4 more
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The proportion of random localized destructive breakdown to stable electroluminescence has been varied continuously by adjusting (1) the recipe used to fabricate dc thin-film electroluminescent devices and (2) the conditions under which they have been tested.
J. M. Blackmore +4 more
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SPIE Proceedings, 1988
A test station was developed to evaluate the TFEL edge emitter array in various imaging applications. It consists of 400-dpi and 20-dpi resolution edge emitter array test samples, a sample mount that accepts both kinds of edge emitters, and an electronic drive system.
Zoltan K. Kun +3 more
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A test station was developed to evaluate the TFEL edge emitter array in various imaging applications. It consists of 400-dpi and 20-dpi resolution edge emitter array test samples, a sample mount that accepts both kinds of edge emitters, and an electronic drive system.
Zoltan K. Kun +3 more
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2012
27th European Photovoltaic Solar Energy Conference and Exhibition; 3041 ...
Ezquer Mayo, M. +4 more
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27th European Photovoltaic Solar Energy Conference and Exhibition; 3041 ...
Ezquer Mayo, M. +4 more
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Examination of PV Panels' Performance Exposed to Environmental Stress with Electroluminescence Tests
2024 8th International Symposium on Multidisciplinary Studies and Innovative Technologies (ISMSIT)The use of electrical energy from solar energy has spread to every area. Today, it has started to be used in every place that receives sunlight, such as building coatings, balconies, streets, highways, etc. In this study, monocrystalline and polycrystalline PV panels used for outdoor lighting were examined.
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Test Set to Evaluate the Electroluminescent Efficiency of Noncontacted GaP Diodes
Review of Scientific Instruments, 1969J. S. Jayson, R. J. Strain
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An A-C Conductive Adhesive for Testing Electroluminescent Devices
Journal of The Electrochemical Society, 1965openaire +1 more source