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Acta Crystallographica Section A Foundations of Crystallography, 1991
T. Jones +4 more
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T. Jones +4 more
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A low-viscosity epoxy resin embedding medium for electron microscopy.
Journal of Ultrastructure Research, 1969A. Spurr
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Automated electron microscope tomography using robust prediction of specimen movements.
Journal of Structural Biology, 2005D. Mastronarde
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Electron Energy-Loss Spectroscopy in the Electron Microscope
Springer US, 1995R. Egerton
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Density-functional approximation for the correlation energy of the inhomogeneous electron gas.
Physical Review B (Condensed Matter), 1986J. Perdew
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Electron-energy-loss spectra and the structural stability of nickel oxide: An LSDA+U study
, 1998S. Dudarev +4 more
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Electron affinities of the first‐row atoms revisited. Systematic basis sets and wave functions
, 1992R. Kendall, T. Dunning, R. Harrison
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Electron–Phonon Interaction and Electron Transport
2001Semiconductor device operation depends on the speed of carriers, electrons and holes, which is determined by the mobility. The mobility μ is expressed by e〈Τ〉/m*, where e, 〈Τ〉, and m* are the electronic charge, average of the relaxation time, and the effective mass.
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