Results 211 to 220 of about 6,472 (259)

Electron holography by planar electron backscattered diffraction patterns

Journal of the Optical Society of America A, 2021
Since Dennis Gabor introduced holography in 1948, it has been of interest to apply it to atomic scales. Electrons with high kinetic energies may indeed be used for electron holography. We describe the holographic process with electron backscatter diffraction (EBSD) as a non-invasive surface structure analysis. We show that typical parameters of current
Matthias, Gianfelice, Carsten, Westphal
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Energy-filtered electron backscatter diffraction

Ultramicroscopy, 2008
The electron backscatter diffraction (EBSD) analytical technique is invaluable for determining the crystallography of bulk alloys, thin films, and nanoparticles. However, our physical understanding of EBSD pattern generation is incomplete, which hinders our ability to push the limits of EBSD analysis. Here, using an energy filter with better than 10 eV
Andrew, Deal, Tejpal, Hooghan, Alwyn, Eades   +2 more
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Electron backscatter diffraction on pearlite structures in steel

Journal of Microscopy, 2006
SummaryElectron backscatter diffraction measurements were performed on a set of pearlitic steel samples after different heat treatments. The strengths and limitations of the technique with respect to the pearlite issue are presented. Interpretation of the obtained results confirmed that more than one pearlite colony may exist inside one ferrite nodule ...
M Seefeldt, B Verlinden, E Aernoudt
exaly   +3 more sources

Quantifying recrystallization by electron backscatter diffraction

Journal of Microscopy, 2004
SummaryThe use of high‐resolution electron backscatter diffraction in the scanning electron microscope to quantify the volume fraction of recrystallization and the recrystallization kinetics is discussed. Monitoring the changes of high‐angle grain boundary (HAGB) content during annealing is shown to be a reliable method of determining the volume ...
H, Jazaeri, F J, Humphreys
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Electron Backscatter Diffraction

2019
Electron backscatter diffraction (EBSD) is a scanning electron microscope (SEM) based technique that is used to obtain local information on the crystallographic character of bulk crystalline and polycrystalline materials. Topics discussed in this article include: EBSD system overview, multiphase analysis, and application to aluminum integrated circuit ...
David P. Field, Mukul Kumar
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The Backscatter Electron Signal as an Additional Tool for Phase Segmentation in Electron Backscatter Diffraction

Microscopy and Microanalysis, 2013
AbstractThe advent of simultaneous energy dispersive X-ray spectroscopy (EDS) data collection has vastly improved the phase separation capabilities for electron backscatter diffraction (EBSD) mapping. A major problem remains, however, in distinguishing between multiple cubic phases in a specimen, especially when the compositions of the phases are ...
E J, Payton, G, Nolze
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Quantitative metallography by electron backscattered diffraction

Journal of Microscopy, 1999
Although electron backscattered diffraction (EBSD) in the scanning electron microscope is used mainly to investigate the relationship between local textures and microstructures, the technique has now developed to the stage where it requires serious consideration as a tool for routine quantitative characterization of microstructures. This paper examines
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A Dictionary Approach to Electron Backscatter Diffraction Indexing

Microscopy and Microanalysis, 2015
AbstractWe propose a framework for indexing of grain and subgrain structures in electron backscatter diffraction patterns of polycrystalline materials. We discretize the domain of a dynamical forward model onto a dense grid of orientations, producing a dictionary of patterns.
Yu H, Chen, Se Un, Park, Dennis, Wei, Greg, Newstadt, Michael A, Jackson, Jeff P, Simmons, Marc, De Graef, Alfred O, Hero   +7 more
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Orientation averaging of electron backscattered diffraction data

Journal of Microscopy, 2001
The use of data averaging to improve the angular precision of electron backscattered diffraction (EBSD) maps is discussed. It is shown that orientations may be conveniently and rapidly averaged using the four Euler‐symmetric parameters which are coefficients of a quaternion representation.
F J, Humphreys, P S, Bate, P J, Hurley
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Electron backscatter diffraction: applications for nuclear materials

Journal of Microscopy, 1999
The diffraction of electrons was first observed in 1928 by Kikuchi. The phenomenon results in the formation of characteristic diagrams of the crystalline lattice and the orientation of the phase. Backscattered electrons are diffracted by the different crystallographic planes (hkl) according to the Bragg angle θb.
, Medevielle, , Hugon, , Dugne
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