Results 1 to 10 of about 8,677 (268)
EBSD and Coupled EBSD/TEM Analysis of Zirconium Deformation Mechanisms [PDF]
Microscopy and Microanalysis, 2006 Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3 ...
RJ McCabe +4 more
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A Dictionary Approach to EBSD Indexing
CoRR, 2015 This paper is in press in the Journal of Microscopy and Microanalysis, Cambridge University Press, Feb ...
Yu-Hui Chen +7 more
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Electron imaging with an EBSD detector
Ultramicroscopy, 2015 Electron Backscatter Diffraction (EBSD) has proven to be a useful tool for characterizing the crystallographic orientation aspects of microstructures at length scales ranging from tens of nanometers to millimeters in the scanning electron microscope (SEM).
Wright, Stuart I. +4 more
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Sample Surface Preparation For Traditional EBSD Collection and 3D EBSD Collection [PDF]
Microscopy and Microanalysis, 2010 Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
REA Williams, A Genc, D Huber, HL Fraser
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A Subgrain‐Size Piezometer Calibrated for EBSD [PDF]
Geophysical Research Letters, 2020 Abstract We calibrate a subgrain‐size piezometer using electron backscatter diffraction (EBSD) data collected from experimentally deformed samples of olivine and quartz. Systematic analyses of angular and spatial resolution test the suitability of each data set for inclusion in calibration of the subgrain‐size ...
Goddard, RM +6 more
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Microscopy and Microanalysis, 2009 Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30 ...
MM Nowell, SI Wright
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An experimental viewpoint on the information depth of EBSD [PDF]
Scanning, 2015 SummaryThis article contains a critical review of the literature concerning the information depth of electron backscatter diffraction (EBSD) and a viewpoint on the topic is formulated. EBSD is applied to a crystal partially covered by a wedge of amorphous glass.
Wolfgang, Wisniewski, Christian, Rüssel
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Optimization of EBSD parameters for ultra‐fast characterization [PDF]
Journal of Microscopy, 2011 SummaryUltra‐fast pattern acquisition of electron backscatter diffraction and offline indexing could become a dominant technique over online electron backscatter diffraction to investigate the microstructures of a wide range of materials, especially for in situ experiments or very large scans.
Chen, Yongjun +3 more
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Microscopy and Microanalysis, 2000 Abstract Background Electron backscattered diffraction (EBSD) is a very powerful analysis technique to understand the crystallography of a sample in the SEM. Typically, a high beam current is needed to obtain good results because of inefficient collection of the patterns.
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Mathematical Evaluation of EBSD Data [PDF]
PAMM, 2010 AbstractIn this work, a short overview is given, how data resulting from Electron Backscatter Diffraction (EBSD) measurements can be used to obtain a discrete version of the Orientation Distribution Function (ODF). Discrete ODFs are necessary, e.g. for micromechanically based simulations of metal forming operations based on the finite element method ...
Andreas Melcher +3 more
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