Results 81 to 90 of about 2,661,374 (307)
Rocksalt MgS solar blind ultra-violet detectors
Studies using in-situ Auger electron spectroscopy and reflection high energy electron diffraction, and ex-situ high resolution X-ray diffraction and electron backscatter diffraction reveal that a MgS thin film grown directly on a GaAs (100) substrate by ...
Ying-Hoi Lai +6 more
doaj +1 more source
This study examines Invar composites reinforced with titanium carbide (TiC) and titanium nitride (TiN) using laser powder bed fusion (LPBF). It presents the influence of reinforcements on microstructure, tensile properties, and thermal expansion. Results show that TiC effectively strengthens Invar while maintaining low thermal expansion, whereas TiN ...
Ayodeji Nathaniel Oyedeji +3 more
wiley +1 more source
Electron backscatter diffraction analysis unveils foraminiferal calcite microstructure and processes of diagenetic alteration [PDF]
Electron backscatter diffraction (EBSD) analysis enables a unique perspective of the internal microstructure of foraminiferal calcite. Specifically, EBSD provides crystallographic data from within the test, highlighting the highly organised “mesocrystal”
F. A. Procter +6 more
doaj +1 more source
Intergranular twinning shear transmission through twin-twin accommodation, which plays an important role on microstructure evolution, is often observed in deformed hexagonal metals.
Xiao Song +5 more
doaj +1 more source
Geochemical and EBSD (electron backscatter diffraction) data test in University of Otago
Major and minor geochemistry information and measured EBSD (electron backscatter diffraction), accompanied with MTEX toolbox scripts ...
Scott, James M +7 more
core +1 more source
Rapidly Solidified High‐Strength Invar 36 Prepared by Planar‐Flow Melt Spinning
The Invar 36 alloy was rapidly solidified using the planar‐flow melt‐spinning technique. Ribbon samples with thicknesses ranging from 20 to 160 mm were produced. As the grain size of the ribbon decreased to sub‐micron levels, the hardness increased by more than 2 times.
Bekir Akgül, Mehmet Kul
wiley +1 more source
We describe the development of cross-correlation based high resolution electron backscatter diffraction (HR-EBSD) and electron channelling contrast imaging (ECCI), in the scanning electron microscope (SEM), to quantitatively map the strain variation and ...
A. Vilalta‐Clemente +6 more
semanticscholar +1 more source
HEA interlayers offer a versatile route for joining high‐performance structural materials. Their compositional and structural design regulates interfacial reactions, suppresses brittle IMCs, and improves metallurgical bonding. Sandwich interlayers further integrate defect healing with precipitation strengthening, enabling improved strength–ductility ...
Lin Yuan +4 more
wiley +1 more source
Neural electron backscatter diffraction
In a polycrystalline microstructure, orientation and dislocation content vary smoothly within grains, and the grain boundaries between them are continuous curves. Electron backscatter diffraction (EBSD) records this continuum on a discrete grid with every subsequent analysis (from indexing to advanced pattern processing) confined to that grid.
Huang, I-Tzu, Latypov, Marat I.
openaire +2 more sources
Strain Mapping Using Electron Backscatter Diffraction
In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a reference pattern.
Wilkinson, A, Dingley, D, Meaden, G
openaire +2 more sources

