Results 271 to 280 of about 296,316 (315)

Change of Electron Temperature in an Electron Beam

Journal of Applied Physics, 1953
The effect of electron encounters on the velocity distribution in an electron beam after passage through an accelerating grid is calculated by direct integration of the Boltzmann equation. It is found, with electron densities and velocities typical of traveling wave tubes and diodes, that the electron encounters have a negligible effect, that the ...
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Electron Beam Therapy

1991
Electron beam radiation is a very important treatment modality in dermatologic radiotherapy. The physical characteristics of electron radiation are well suited for treatment of superficial lesions, since the depth of penetration of the radiation can be precisely controlled, with little exposure of deeper tissues. Additionally, compared with superficial
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Electron Beam-induced Current

2001
The article summarizes the main theoretical issues at the basis of the application of EBIC (Electron Beam-induced Current) method to the study of fundamental properties of semiconductors such as minority carrier lifetime and diffusion length, dopant concentration, and nonradiative recombination efficiency of extended defects.
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Measurement of the electron cyclotron energy component of the electron beam of an electron beam ion trap

Physical Review E, 2001
The energy component associated with the cyclotron motion of the beam electrons in the Livermore EBIT-II electron beam ion trap was inferred from measurements of the linear polarization of the K-shell x-ray lines emitted from helium-like Mg(10+) ions. The average line polarization was found to be reduced by about 20% from its nominal value.
P, Beiersdorfer, M, Slater
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Electron beam ion source and electron beam ion trap (invited)

Review of Scientific Instruments, 2010
The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades.
Reinard, Becker, Oliver, Kester
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Beam Stop for Electron Accelerator Beam Characterisation

IEEE Transactions on Nuclear Science, 2008
Electron linear accelerator applications involving the generation of hard X-rays frequently require accurate knowledge of the electron beam parameters. We developed a beam stop device which houses a tungsten Bremsstrahlung target and enables the electron beam current, energy and position to be monitored.
Greg Roach, Vic Sharp, James Tickner, Josef Uher   +3 more
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Electron-electron interaction induced beam displacement in a multiple electron beam system

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 2005
We have studied electron-electron (e-e) interaction induced beam displacement in multiple electron beam systems both experimentally and using trajectory simulation. A prototype 32-beam lithography system was used to record the beam displacements on chrome mask plates and the latter were directly measured by electron microscopy.
Ming L. Yu, Steven T. Coyle, William DeVore, Bassam Shamoun   +3 more
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Study of Displacement Value of the Electron-Beam in the Electron Gun in Electron-Beam Furnace

Advanced Materials Research, 2013
The concept of maximal and minimal displacement value of the electron-beam was proposed considering the influence of space charge effect based on the displacement value of the electron-beam in the process of magnetic deflection scanning in the ideal condition.
Dong Hui Zhang, Chun Dong Liu, Jian Ming Liang, Chang Sheng Li   +3 more
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Electron Beams

Clinical electron beams have a sharp dose fall-off beyond a specific depth and definite range that is unique to each beam energy, making them a preferred modality for treating superficial lesions with sensitive structures beneath. In modern radiation oncology, approximately 3–10% of the patients would require electron beam therapy.
Tharmarnadar Ganesh, Prabhakar Ramachandran   +1 more
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Electron Beam Testing

Microelectronic Engineering, 1986
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