Results 281 to 290 of about 3,357,616 (331)

Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Microscopy and Microanalysis, 2013
The aberration-corrected scanning transmission electron microscope has great sensitivity to environmental or instrumental disturbances such as acoustic, mechanical, or electromagnetic interference.
L. Jones, P. Nellist
semanticscholar   +1 more source

Nanometres‐resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope

Journal of Microscopy, 2013
A charge‐coupled device camera of an electron backscattered diffraction system in a scanning electron microscope was positioned below a thin specimen and transmission Kikuchi patterns were collected.
N. Brodusch, H. Demers, R. Gauvin
semanticscholar   +1 more source

Salpingoscopy: Light microscopic and electron microscopic correlations

International Journal of Gynecology & Obstetrics, 1992
In order to examine the ability of salpingoscopy to diagnose intratubal pathology, 32 fallopian tubes were evaluated salpingoscopically and histologically. Both flexible and rigid salpingoscopes were used, and observations were documented by intratubal photography.
Alan H. DeCherney, Alan H. DeCherney, Michael P. Diamond, Michael P. Diamond, Michael P. Diamond, Dorothy L. Patton, Dorothy L. Patton, David B. Seifer, David B. Seifer, Maria Luisa Carcangiu, Maria Luisa Carcangiu, Avner Hershlag   +11 more
openaire   +3 more sources

Electron ptychography of 2D materials to deep sub-ångström resolution

Nature, 2018
Aberration-corrected optics have made electron microscopy at atomic resolution a widespread and often essential tool for characterizing nanoscale structures.
Yi Jiang, Zhen Chen, Yimo Han, P. Deb, Hui Gao, Saien Xie, P. Purohit, M. Tate, Jiwoong Park, S. Gruner, V. Elser, D. Muller   +11 more
semanticscholar   +1 more source

The Transmission Electron Microscope

1998
This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanning modes). It starts with the fundamental physics of electron dynamics for energies in the range 100–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are ...
openaire   +2 more sources

Transmission EBSD from 10 nm domains in a scanning electron microscope

, 2012
The spatial resolution of electron diffraction within the scanning electron microscope (SEM) has progressed from channelling methods capable of measuring crystallographic characteristics from 10 μm regions to electron backscatter diffraction (EBSD ...
R. Keller, R. Geiss
semanticscholar   +1 more source

Integration of a confocal Raman microscope in an electron microscope

SPIE Proceedings, 2000
In this research project a confocal Raman micro spectrometer (CRM) will be designed and incorporated in a scanning electron microscope (SEM). The aim is to develop a new analytical instrumentation to investigate samples on their morphology, atomic composition and molecular composition. Application of the CRM-SEM is in the field of bio-material research
J. D. de Bruijn, Cees Otto, Jan Greve, C. A. van Blitterswijk, E. G. I. Reinders, Y. Aksenov   +5 more
openaire   +3 more sources

Electron Microscope Autoradiography

1966
The opportunity to accurately localize radioactive substances in tissues at the cellular level became available with the introduction of relatively low energy beta-emitters, combined with the techniques of autoradiography. The major advantage offered by autoradiography is the ability to infer the location of individual molecules on the basis of the ...
openaire   +3 more sources

TECHNIQUES FOR THE PRESERVAATION OF THREE-DIMENSIONAL STRUCTURE IN PREPARING SPECIMENS FOR THE ELECTRON MICROSCOPE†

, 1951
Before examination of biological specimens can take place all volatiles must be removed. This presented paper details a method of sample preparation that reduces distortion and maintains 3-dimensional structure.
T. F. Anderson
semanticscholar   +1 more source

The Transmission Electron Microscope

1996
A typical commercial transmission electron microscope (TEM) costs about $5 for each electron volt (eV) of energy in the beam and, if you add on all available options, it can easily cost up to $10 per eV. As you’ll see, we use beam energies in the range from 100,000 to 400,000 eV, so a TEMis an extremely expensive piece of equipment. Consequently, there
C. Barry Carter, David B. Williams
openaire   +2 more sources