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Electron phase microscope

1960
Since the beginning of the electron microscopy, it has been well known that the phase contrast due to interference of the coherent wave plays a very important role in image formation. Distinctive examples are: Fresnel diffraction fringes as demonstrated by Boersch (1), Hisi (2) and others; interference fringes in crystals by Heidenreich (3) and Menter (
Koichi Kanaya, Hisazo Kawakatsu
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The Electron Microscope

Industrial & Engineering Chemistry, 1942
T. G. Rochow   +2 more
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The Scanning Electron Microscope [PDF]

open access: possible, 2005
As we discussed in Chapter 1, the scanning electron microscope (SEM) was invented soon after the TEM but took longer to be developed into a practical tool for scientific research. As happened with the TEM, the spatial resolution of the instrument improved after magnetic lenses were substituted for electrostatic ones and after a stigmator was added to ...
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The Transmission Electron Microscope [PDF]

open access: possible, 2005
As we saw in Chapter 1, the TEM is capable of displaying magnified images of a thin specimen, typically with a magnification in the range 103 to 106. In addition, the instrument can be used to produce electron-diffraction patterns, useful for analyzing the properties of a crystalline specimen.
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Transmission Electron Microscopy

, 2008
Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron-Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ...
Ludwig Reimer, Helmut Kohl
semanticscholar   +1 more source

Light microscope rivals electron microscope

Chemical & Engineering News Archive, 1993
By combining a simple, low-power laser with a standard light microscope, scientists at the University of California, Berkeley, have created a "laserfeedback microscope" with a resolution that rival...
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A 100-kv Electron Microscope

Journal of Applied Physics, 1944
In this paper a transmission type electron microscope with magnetic lenses is described. The electron speed can be varied between 30 ekv and 100 ekv. The magnification of the instrument is produced in three stages. The instrument has improved air locks, hydraulically operated stage movement, and a stage tilting device up to ±15½°.
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The analytical electron microscope

Journal of Physics E: Scientific Instruments, 1986
A concise account is given of the principal features and capabilities of analytical transmission electron microscopes. With these microscopes the internal and surface structures, crystallinity and elemental composition of specimens can be examined with high spatial resolution in a single instrument.
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