Results 11 to 20 of about 6,081,547 (327)

py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis [PDF]

Microscopy and Microanalysis, 2020
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms.
B. Savitzky, S. Zeltmann, L. Hughes, H. Brown, Shiteng Zhao, Philipp M. Pelz, T. Pekin, E. Barnard, J. Donohue, L. Rangel DaCosta, E. Kennedy, Yujun Xie, M. Janish, Matthew M. Schneider, Patrick K. Herring, C. Gopal, Abraham Anapolsky, R. Dhall, K. Bustillo, P. Ercius, M. Scott, J. Ciston, A. Minor, C. Ophus   +23 more
semanticscholar   +1 more source

Fully automated multi-grid cryoEM screening using Smart Leginon

IUCrJ, 2023
Single-particle cryo-electron microscopy (cryoEM) is a swiftly growing method for understanding protein structure. With increasing demand for high-throughput, high-resolution cryoEM services comes greater demand for rapid and automated cryoEM grid and ...
Anchi Cheng, Paul T. Kim, Huihui Kuang, Joshua H. Mendez, Eugene Y. D. Chua, Kashyap Maruthi, Hui Wei, Anjelique Sawh, Mahira F. Aragon, Viacheslav Serbynovskyi, Kasahun Neselu, Edward T. Eng, Clinton S. Potter, Bridget Carragher, Tristan Bepler, Alex J. Noble   +15 more
doaj   +1 more source

Scanning Electron Microscopy [PDF]

Current Protocols in Microbiology, 2012
AbstractScanning electron microscopy (SEM) remains distinct in its ability to allow topographical visualization of structures. Key elements to consider for successful examination of biological specimens include appropriate preparative and imaging techniques.
Elizabeth R, Fischer, Bryan T, Hansen, Vinod, Nair, Forrest H, Hoyt, David W, Dorward   +4 more
openaire   +2 more sources

Scanning ultrafast electron microscopy [PDF]

, 2010
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200
Mohammed, Omar F., Yang, Ding-Shyue, Zewail, Ahmed H.   +2 more
core   +1 more source

THE USE OF LEAD CITRATE AT HIGH pH AS AN ELECTRON-OPAQUE STAIN IN ELECTRON MICROSCOPY

Journal of Cell Biology, 1963
Aqueous solutions of lead salts (1, 2) and saturated solutions of lead hydroxide (1) have been used as stains to enhance the electron-scattering properties of components of biological materials examined in the electron microscope.
E. Reynolds
semanticscholar   +1 more source

Direct detectors and their applications in electron microscopy for materials science

, 2021
The past decade has seen rapid advances in direct detector technology for electron microscopy. Direct detectors are now having an impact on a number of techniques in transmission electron microscopy (TEM), scanning electron microscopy, and scanning TEM ...
B. Levin
semanticscholar   +1 more source

3D characterization of CdSe nanoparticles attached to carbon nanotubes [PDF]

, 2008
The crystallographic structure of CdSe nanoparticles attached to carbon nanotubes has been elucidated by means of high resolution transmission electron microscopy and high angle annular dark field scanning transmission electron microscopy tomography ...
A. B. F. Martinson, A. J. Nozik, A. W. Stevenson, Ana B. Hungría, B. H. Juarez, B. Q. Sun, Beatriz H. Juárez, C. B. Murray, Christian Klinke, D. J. Milliron, D. V. Talapin, D. V. Talapin, H. Lee, Horst Weller, I. Robel, J. C. Hernandez, J. J. Cha, J. Joo, J. Park, L. H. Qu, L. Manna, L. Manna, L. Sheeney-Haj-Khia, M. A. Anderson, M. A. Hines, M. Casavola, O. Ersen, O. I. Micic, P. A. Midgley, P. S. Nair, P. V. Kamat, P. Wang, Paul A. Midgley, R. Plass, S. A. Mcdonald, S. Bernal, S. C. Erwin, T. Mokari, V. Perebeinos, W. U. Huynh, W. W. Yu, W. Z. Ostwald, X. G. Peng, Y. W. Jun, Z. A. Peng, Z. A. Peng, Z. A. Peng   +46 more
core   +1 more source

Deep learning in electron microscopy [PDF]

Machine Learning: Science and Technology, 2020
Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning
Jeffrey M. Ede
semanticscholar   +1 more source

A combined FEG-SEM and TEM study of silicon nanodot assembly [PDF]

, 2008
Nanodots forming dense assembly on a substrate are difficult to characterize in terms of size, density, morphology and cristallinity. The present study shows how valuable information can be obtained by a combination of electron microscopy techniques.
B. Caussat, Cocheteau, Donnadieu, E. Scheid, F. Roussel, Hytch, Losurdoa, Mazen, Nicotra, P. Donnadieu, P. Mur, Puglisi, Renault, Tiwari, V. Cocheteau   +14 more
core   +3 more sources

Advanced method for the accurate measurement of tilt angle in a transmission electron microscopy goniometer

Journal of Analytical Science and Technology, 2018
Background In order to improve the reliability of the electron tomography (ET) technique, which reveals three-dimensional information of nanostructured materials from a series of tilted two-dimensional images, it is essential that the mechanical tilt ...
Ji-Hyun Lee, Hoyoung Suh, Sang-Gil Lee, Jin-Gyu Kim, Seung Jo Yoo   +4 more
doaj   +1 more source