Results 21 to 30 of about 6,641 (217)

Phase-shifting algorithms for electronic speckle pattern interferometry [PDF]

Applied Optics, 2002
A set of innovative phase-shifting algorithms developed to facilitate metrology based on electronic speckle pattern interferometry (ESPI) are presented. The theory of a phase-shifting algorithm, called a (5,1) algorithm, that takes five phase-shifted intensity maps before a specimen is deformed and one intensity map after a specimen is deformed is ...
Chih-Cheng, Kao, Gym-Bin, Yeh, Shu-Sheng, Lee, Chih-Kung, Lee, Ching-Sang, Yang, Kuang-Chong, Wu   +5 more
openaire   +2 more sources

Characterization of microdot apodizers for imaging exoplanets with next-generation space telescopes [PDF]

, 2018
A major science goal of future, large-aperture, optical space telescopes is to directly image and spectroscopically analyze reflected light from potentially habitable exoplanets.
Beuzit, Delorme, Floyd, Jewell, Macintosh, Mawet, Mennesson, Pueyo, Ruane, Sivaramakrishnan, Ulichney   +10 more
core   +3 more sources

Modern optical astronomy: technology and impact of interferometry [PDF]

, 2002
The present `state of the art' and the path to future progress in high spatial resolution imaging interferometry is reviewed. The review begins with a treatment of the fundamentals of stellar optical interferometry, the origin, properties, optical ...
Ables, J. G., Aime, C., Akeson, R., Anderson, J. A., Angel, J. R. P., Angel, J. R. P., Angel, J. R. P., Angel, J. R.,, Antoshkin, L. V., Aretxaga, I., Armstrong, J.,, Arnold, L., Ayers, G. R., Baba, N., Baba, N., Baba, N., Babcock, H. W., Babcock, H. W., Bagnuolo, W. G., Jr., Baldwin, J., Baldwin, J., Baldwin, J., Baldwin, J. E., Baldwin, J. E., Balick, B., Barlow, M. J., Barnaby, D., Beckers, J. M., Bedding, T., Bedding, T. R., Beichman, C., Benson, J., Berger, J., Berio, P., Berio, P., Bester, M., Blazit, A., Blöcker, T., Boccaletti, A., Boccaletti, A., Boden, A.,, Bonneau, D.,, Bonneau, D.,, Bouvier, J., Bracewell, R. N., Brandl, B., Brandner, W., Bruns, D., Burge, J. H., Burns, D., Burns, D., Butler, R.,, Cadot, O., Callados, M.,, Carleton, N., Cassinelli, J., Charbonneau, D., Clampin, M., Clampin, M., Close, L., Colavita, M., Colavita, M., Colavita, M.,, Conan, J.-M., Conan, R., Cooper, D., Cornwell, T. J.,, Coudé du Foresto, V., Coulman, C. E., Coulman, C. E., Currie, D., Danchi, W. C., Danchi, W. C., Dantowitz, R., Davidge, T. J., Davidge, T. J., Davis, J., Davis, J., Davis, J., Davis, J., Dayton, D., Dejonghe, J., Denker, C., Derie, F., DiBenedetto, G. P., Drummond, J., Dullemond, C. P., Dyck, H., Dyck, H., Ebstein, S., Eke, V., Elias, N. M., Falcke, H., Faucherre, M., Fienup, J. R., Fischer, O., Fizeau, H., Foy, R., Foy, R., Fried, D. L., Fugate, R., Gauger, A., Gerchberg, R. W., Gies, R., Glindemann, A., Golimowski, D. A., Gonsalves, S. A., Gorham, P. W., Greenwood, D. P., Haguenauer, P., Hajian, A., Hale, D., Hale, D., Hanbury Brown, R., Hanbury Brown, R., Haniff, C., Harmanec, P., Hartley, M., Harvey, J. W., Harvey, J. W., Hawley, S. A., Hege, E., Hestroffer, D., Heydari, M., Hill, J. M., Hinz, P., Hofmann, K.-H., Hummel, C., Hutchings, J., Hutchings, J., Hutchings, J., Högbom, J., Jefferies, S., Jennison, R. C., Karovska, M., Kenworthy, M., Kervella, P., Knox, K., Koechlin, L., Korff, D., Kunz, M., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Lai, O., Lai, O., Lane, B., Lannes, A., Lawson, P., Lawson, P., Lawson, P. R., Lawson, P. R., Ledoux, C., Lee, J., Lefèvre, H. C., Liang, J., Lindengren, L., Lipman, E., Liu, Y. C., Lloyd-Hart, M., Lloyd-Hart, M., Lohmann, A., Lopez, B., Lovelock, J. E., Lucy, L., Lynds, C., Léger, A., Machida, Y., Mackay, C. D., Magain, P., Malbet, F., Marco, O., Masciadri, E., Mason, B., Mason, B. D., Mayor, M., McAlister, H., Mennesson, B., Men’shchikov, A., Michelson, A. A., Michelson, A. A., Millan-Gabet, R., Monnier, J., Monnier, J., Monnier, J., Morel, S., Morel, S., Mouillet, D., Mourard, D., Mourard, D., Mozurkewich, D., Márquez, I., Nakajima, T., Nakajima, T., Natta, A., Nelkin, M., Nisenson, P., Nisenson, P., Nordgren, T., Northcott, M. J., Nota, A., Nulsen, P., Padilla, C., Papaliolios, C., Papaliolios, C., Pauls, T., Paxman, R., Pedretti, E., Pedretti, E., Pehlemann, E., Penny, A., Perrin, G., Perrin, G., Perrin, G., Perryman, M. A. C., Poulet, F., Pourbaix, D., Prieur, J., Quirrenbach, A., Quirrenbach, A., Quirrenbach, A., Rabbia, Y., Ragazzoni, R., Reinheimer, T., Richardson, W. H., Ridgway, S. T., Rimmele, T. R., Robbe, S., Robertson, N. A., Roddier, C., Roddier, F., Roddier, F., Roddier, F., Roddier, F., Roggemann, M. C., Rouan, D., Rouan, D., Rouan, D., Rousselet-Perraut, K., Rousset, G., Ryan, S., Saha, S. K., Saha, S. K., Saha, S. K., Saha, S. K., Saha, S. K., Saha, S. K., Sams, B. J., Sato, K., Schertl, D., Schöller, M., Seldin, J., Seldin, J., Serabyn, E., Shannon, C. J., Shao, M., Shao, M., Shao, M., Sicardy, B., Simon, M., Stee, P., Stee, P., Swapan K. Saha, Tango, W. J., Tatarski, V. I., Thom, C., Thompson, L. A., Timothy, J. G., Torres, G., Townes, C. H., Traub, W. A., Traub, W. A., Traub, W. A., Troxel, S. E., Tuthill, P., Tuthill, P., Tuthill, P. G., Tuthill, P. G., Tuthill, P. G., Ulrich, M., Unwin, S., Vakili, F., Vakili, F., van Belle, G., van Belle, G., van Belle, G., Von der Lühe, O., Walkup, J. F., Wallace, J., Weigelt, G., Weigelt, G., Weigelt, G., Weigelt, G., Weigelt, G., Weinberger, A., Wilken, V., Wilson, R., Wittkowski, M., Wittkowski, M., Wittkowski, M., Wittkowski, M., Wood, P., Wood, P., Worden, S. P., Wyngaard, J. C., Young, A. T., Young, J.   +312 more
core   +2 more sources

Designing Physical Unclonable Functions From Optically Active Materials. [PDF]

Adv Mater
Assigning unforgeable “fingerprints” to manufactured goods is a key strategy to fight global counterfeiting. Optical physical unclonable functions (PUFs) are chemically generated random patterns of optically active materials serving as unique authenticators.
Klausen M, Zhang J, Stevens MM.
europepmc   +2 more sources

Oblique incidence and observation electronic speckle-pattern interferometry [PDF]

Applied Optics, 1994
In this paper we discuss an oblique incidence and observation electronic speckle-pattern interferometer, in which we use an anamorphic prism in front of the object. A collimated beam traveling through the prism is partly reflected at the base of the prism.
Joenathan, Charles, Franze, Bernhard, Tiziani, Hans J.   +2 more
openaire   +3 more sources

ESPI nondestructive testing for coating interface failure

工程科学学报, 2016
A detection platform of coating failure processes was designed and constructed on the basis of laser electronic speckle pattern interferometry(ESPI).
GAO Jin, SHEN Lin, FENG Hai-xiang, JIANG Hong-xia, LI Xiao-gang   +4 more
doaj   +1 more source

On-sky speckle nulling demonstration at small angular separation with SCExAO [PDF]

, 2014
This paper presents the first on-sky demonstration of speckle nulling, which was achieved at the Subaru Telescope in the context of the Subaru Coronagraphic Extreme Adaptive Optics (SCExAO) Project.
Clergeon, Christophe, Currie, Thayne, Guyon, Olivier, Jovanovic, Nemanja, Kudo, Tomoyuki, Martinache, Frantz, McElwain, Michael, Singh, Garima, Tamura, Motohide, Thalmann, Christian   +9 more
core   +5 more sources

High-speed electronic speckle pattern interferometry [PDF]

, 2004
Electronic Speckle Pattern Interferometry (ESPI) is used to measure surface displacements. Phase shifting can be used to obtain a fringe pattern which depicts the phase at every point in an image. Previous studies have used algorithms such as the 4-bucket algorithm to obtain phase maps of objects.
openaire   +2 more sources

Adaptive Aperture Defocused Digital Speckle Photography

, 2005
Speckle photography can be used to monitor deformations of solid surfaces. The measuring characteristics, such as range or lateral resolution depend heavily on the optical recording and illumination set-up.
Diazdelacruz, Jose M.
core   +1 more source

Adaptive Speckle Imaging Interferometry: a new technique for the analysis of microstructure dynamics, drying processes and coating formation

, 2007
We describe an extension of multi-speckle diffusing wave spectroscopy adapted to follow the non-stationary microscopic dynamics in drying films and coatings in a very reactive way and with a high dynamic range.
Brun, Alice, Brunel, Laurent, Cipelletti, Luca, Snabre, Patrik   +3 more
core   +2 more sources