Results 271 to 280 of about 1,607,152 (325)
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A new electrostatic discharge failure mode

IEEE Transactions on Electron Devices, 1978
A new electrostatic discharge failure mode was discovered which affects MOS LSI components in hermetic packages with nonconductive lids. Failure can be induced by spraying package lids with canned coolant. It is shown that charge from the freeze spray causes breakdown in the air-gap between the die surface and the lid.
M. H. Woods, G. Gear
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Electrostatic Dischargers for Aircraft

Journal of Applied Physics, 1947
Methods of discharging static electricity from aircraft in flight so as to reduce or eliminate corona interference, commonly known as precipitation static, are discussed. These methods have been classified into those employing either gaseous ions (high mobility), or those employing charge carriers such as water spray or dust particles (low mobility ...
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Fields radiated by electrostatic discharges

IEEE Transactions on Electromagnetic Compatibility, 1991
Electrostatic discharge (ESD) fields are examined both analytically and experimentally. Measurements indicate that the electric fields can be quite significant (>or=150 V/m at a distance at 1.5 m, for example) for short periods of time (a few nanoseconds), particularly for relatively low-voltage events ( >
P.F. Wilson, M.T. Ma
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Internal Electrostatic Discharge Monitor (IESDM)

IEEE Transactions on Nuclear Science, 2010
An internal electrostatic discharge monitor (IESDM) is being developed at JPL that measures the depth profile of potential in dielectrics. The JPL IESDM is described in this paper with an initial test result using electron beam.
Wousik Kim   +2 more
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Standardization of electrostatic discharge testing

IEEE 1988 International Symposium on Electromagnetic Compatibility, 2003
An overview is given of the activities and directions of the various worldwide committees working on the electrostatic discharge (ESD) phenomena. The current technical issues, position, and documentation status are discussed for each committee. The technical aspects of the work done to date, as well as its resolution or discrepancies, are presented. >
D.M. Staggs, D.J. Pratt
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Simulation of electrostatic discharges

Journal of Electrostatics, 1990
Abstract The prime cause of breakdown in electronic equipment today is still the effect of electrostatic discharge (ESD). The precise and reproducible simulation of such discharges using standardised and internationally recognised procedures is an indispensable tool for improving the quality of an electronic product by identifying potential weak ...
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Electrostatic Discharge (ESD)

2014
This chapter discusses the effect of external electrostatic discharge (ESD), or induced field and secondary discharges to a product as a part of EMC compliance testing. It includes the following topics: ESD checklist; typical failure modes; trouble shooting at the test laboratory; low-cost testing tools; and typical fixes.
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Interfacial Dual‐Modulation via Cationic Electrostatic Shielding and Anionic Preferential Adsorption toward Planar and Reversible Zinc Electrodeposition

Advanced Functional Materials
Rechargeable aqueous zinc‐ion batteries (ZIBs) with low cost and high safety arouse most promises as next‐generation energy storage configurations. Yet the heterogeneous electric field distributions and interfacial side reactions are considered stumbling
Huan Tang   +10 more
semanticscholar   +1 more source

Electrostatic discharge: a review

IEE Colloquium on ESD (Electrostatic Discharge) and ESD Counter Measures, 1995
The advent of practical problems associated with electrostatic discharge (ESD) has reawakened a wider interest in static electricity and again brought it to the fore. One of the main practical problems has been as a consequence of electronic circuits getting smaller, since it takes less energy to destroy them. While this paper mainly addresses ESD with
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Electrostatic Discharge Threat

International Journal of Innovative Science and Research Technology
Static electricity, or electrostatic discharge (ESD), presents a significant threat to the performance and reliability of digital electronic circuits. As digital devices become increasingly miniaturized and densely packed, they become more vulnerable to ESD-related failures.
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