Results 61 to 70 of about 148,798 (321)

Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes

, 2000
We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multi-walled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled carbon ...
A. Bachtold, A. Bachtold, A. Thess, A. Zettl, C. Schönenberger, C. Schönenberger, C. T. White, Erik H. Anderson, H. Dai, J. E. Stern, J. Kong, J. Kong, K. Tsukagoshi, L. Langer, M. A. Eriksson, M. Bockrath, M. Bockrath, M. Büttiker, M. Forero, M. P. Anantram, M. S. Fuhrer, M. S. Fuhrer, P. Collins, P. J. de Pablo, P. L. McEuen, Paul L. McEuen, R. Martel, S. Frank, S. J. Tans, S. J. Tans, S. Plyasunov, T. Ando, Y. Martin, Z. Yao, Z. Yao   +34 more
core   +1 more source

Peroxidasin enables melanoma immune escape by inhibiting natural killer cell cytotoxicity

Molecular Oncology, EarlyView.
Peroxidasin (PXDN) is secreted by melanoma cells and binds the NK cell receptor NKG2D, thereby suppressing NK cell activation and cytotoxicity. PXDN depletion restores NKG2D signaling and enables effective NK cell–mediated melanoma killing. These findings identify PXDN as a previously unrecognized immune evasion factor and a potential target to improve
Hsu‐Min Sung, David Bickel, Lena C. M. Krause, Daria Ezeriņa, Christian Ickes, Julian Wojtachnia, Christine S. Gibhardt, Magdalena Shumanska, Khadija Wahni, Andrea Paluschkiwitz, Julia Malo Pueyo, Ekaterina Baranova, Wim Vranken, Hedwig Stanisz, Ioana Stejerean‐Todoran, Michael P. Schön, Joris Messens, Ivan Bogeski   +17 more
wiley   +1 more source

Demonstration of an electrostatic-shielded cantilever

, 2005
The fabrication and performances of cantilevered probes with reduced parasitic capacitance starting from a commercial Si3N4 cantilever chip is presented.
Alessandrini, A., Ascoli, C., Baschieri, P., Facci, P., Menozzi, C., Piazza, V., Pingue, P.   +6 more
core   +1 more source

Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy [PDF]

, 2010
In order to measure the dielectric permittivity of thin insulting layers, we developed a method based on electrostatic force microscopy (EFM) experiments coupled with numerical simulations.
Alegría, Angel, Arinero, Richard, Colmenero, Juan, De Oteyza, Dimas G., Lévêque, Gérard, Ramonda, Michel, Riedel, Clément, Schwartz, Gustavo Ariel, Tordjeman, Philippe   +8 more
core   +2 more sources

Analysis of Treacher Collins syndrome 4‐associated mutations in Schizosaccharomyces pombe

FEBS Open Bio, EarlyView.
Fission yeast models carrying Treacher Collins syndrome type 4‐associated mutations reveal that impaired processivity of RNA polymerase I leads to defective rRNA transcription. This study highlights the essential role of a conserved arginine residue in Pol I elongation and provides mechanistic insight into the pathogenesis of ribosomopathies.
Kei Kawakami, Hiroaki Kato
wiley   +1 more source

Electrostatic interaction in atomic force microscopy

Biophysical Journal, 1991
In atomic force microscopy, the stylus experiences an electrostatic force when imaging in aqueous medium above a charged surface. This force has been calculated numerically with continuum theory for a silicon nitrite or silicon oxide stylus. For comparison, the Van der Waals force was also calculated.
openaire   +3 more sources

Understanding the Effect of Resistance Temperature Detector Temperature Controllers on Microstructural Alignment in Magnetic Freeze Casting

Advanced Engineering Materials, EarlyView.
The effect of temperature controllers that are commonly used in freeze‐casting is investigated in this work. Temperature controllers are observed to generate a voltage in the slurry. Microstructural alignment and ultimate compressive strength data show this voltage to interfere with the ability to align the microstructure using magnetic fields ...
Maddie A. Schmitz, Steven E. Naleway
wiley   +1 more source

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Beilstein Journal of Nanotechnology, 2015
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer   +6 more
doaj   +1 more source

Intermodulation electrostatic force microscopy for imaging surface photo-voltage

, 2014
We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance ...
Daniel Forchheimer, David B. Haviland, Jonas Bergqvist, Melcher J., Olle Inganäs, Per-Anders Thorén, Riccardo Borgani   +6 more
core   +1 more source

Method to calculate electric fields at very small tip-sample distances in atomic force microscopy [PDF]

, 2010
Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.A method to calculate electric magnitudes at very small tip ...
Sacha, Gómez Moñivas
core   +2 more sources