Results 81 to 90 of about 149,709 (288)

Dynamic Behavior in Piezoresponse Force Microscopy

open access: yes, 2005
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements.
Abplanalp M   +23 more
core   +1 more source

Packaging of Macroscopic Material Payloads: Needs, Challenges, Concepts, and Future Directions

open access: yesAdvanced Engineering Materials, EarlyView.
This review introduces a unified framework that decomposes any macroscopic packaging system into the payload, packaging material, and packaging strategy and combines them into a conceptual packaging equation: packaging strategy = payload + packaging material.
Venkata S. R. Jampani, Manos Anyfantakis
wiley   +1 more source

Demonstration of an electrostatic-shielded cantilever

open access: yes, 2005
The fabrication and performances of cantilevered probes with reduced parasitic capacitance starting from a commercial Si3N4 cantilever chip is presented.
Alessandrini, A.   +6 more
core   +1 more source

Zein‐Based Adhesives: Sustainable Extraction and Application in Bioadhesive Technologies

open access: yesAdvanced Engineering Materials, EarlyView.
Zein is extracted from corn gluten meal using a simple and scalable process with high yield (~90%). The resulting protein is applied in bioadhesives modified with Ca2+ and Fe3+ ions, exhibiting substrate‐dependent adhesion. The findings demonstrate competitive bonding performance and highlight the role of ionic interactions in tuning adhesion ...
Paula Bertolino Sanvezzo   +3 more
wiley   +1 more source

Probing the dopant profile in nanoscale devices by low temperature electrostatic force microscopy

open access: yesAIP Advances, 2019
Probing dopant distributions in nanoscale devices may find important applications in failure analysis. In this work, we employed cryogenic electrostatic force microscopy (EFM) to probe the dopant distribution in a lateral nanoscale bipolar junction ...
Wanqing Wang   +4 more
doaj   +1 more source

Contrast Mechanisms for the Detection of Ferroelectric Domains with Scanning Force Microscopy

open access: yes, 2008
We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on hexagonally poled lithium niobate.
Alexe M   +10 more
core   +1 more source

Characterization of Nitinol Produced by Laser Powder Bed Fusion for Mechanical Metamaterial Applications

open access: yesAdvanced Engineering Materials, EarlyView.
Stabilization of L‐PBF Ni50.7Ti49.3 under low‐cycle loading was investigated. Recoverable strain after cycling was dependent on the amount of applied load. Recovery ratio was 53.4% and 35.1% at intermediate and high load, respectively. The maximum total strain reached 10.3% at a high load of 1200 MPa.
Ondřej Červinek   +5 more
wiley   +1 more source

Direct creation of micro-domains with positive and negative surface potential on hydroxyapatite coatings

open access: yes, 2011
A method for the direct patterning of electrostatic potential at the surface of hydroxyapatite is presented here. Micro-domains of surface potential have been created on hydroxyapatite coatings by a 20 keV focused electron beam with minimal alterations ...
Durina, P.   +11 more
core   +1 more source

A Numerical–Experimental Approach for Multi‐Matrix Fiber‐Reinforced Plastics Characterization Using Finite Element Model Updating

open access: yesAdvanced Engineering Materials, EarlyView.
A numerical–experimental framework is developed for characterizing multi‐matrix fiber‐reinforced polymers (MM‐FRPs) combining epoxy and polyurethane matrices. Harmonic bending tests are integrated with finite element model updating (FEMU) to simultaneously identify elastic and viscoelastic material parameters.
Rodrigo M. Dartora   +4 more
wiley   +1 more source

Nanoelectromechanics of Piezoresponse Force Microscopy

open access: yes, 2004
To achieve quantitative interpretation of Piezoresponse Force Microscopy (PFM), including resolution limits, tip bias- and strain-induced phenomena and spectroscopy, analytical representations for tip-induced electroelastic fields inside the material are
A.L. Kholkin   +16 more
core   +1 more source

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