Results 1 to 10 of about 2,263 (164)

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy [PDF]

Beilstein Journal of Nanotechnology
We present multifrequency heterodyne electrostatic force microscopy (MFH-EFM) as a novel electrostatic force microscopy method for nanoscale capacitance characterization at arbitrary frequencies above the second cantilever resonance.
Pascal N. Rohrbeck, Lukas D. Cavar, Franjo Weber, Peter G. Reichel, Mara Niebling, Stefan A. L. Weber   +5 more
doaj   +2 more sources

Using Electrostatic Mapping to Understand PANI-MWCNTs’ NH₃ Sensing [PDF]

Sensors
This study investigates the electrostatic and electrochemical behavior of polyaniline (PANI) and its composite with amine-functionalized multi-walled carbon nanotubes (PANI/MWCNT–NH2) to elucidate the mechanisms governing ammonia (NH3) sensing.
Alessia Famengo, Carmen Marinela Mihailescu, Mihaela Savin, Alexandru Grigoroiu, Carmen Moldovan, Maria Losurdo   +5 more
doaj   +2 more sources

Probing Polymorphic Stacking Domains in Mechanically Exfoliated Two-Dimensional Nanosheets Using Atomic Force Microscopy and Ultralow-Frequency Raman Spectroscopy [PDF]

Nanomaterials
As one of the key features of two-dimensional (2D) layered materials, stacking order has been found to play an important role in modulating the interlayer interactions of 2D materials, potentially affecting their electronic and other properties as a ...
Chengjie Pei, Jindong Zhang, Hai Li
doaj   +2 more sources

Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM) [PDF]

Ultramicroscopy, 2011
In this work we present a new AFM based approach to measure the local dielectric response of polymer films at the nanoscale by means of Amplitude Modulation Electrostatic Force Microscopy (AM-EFM). The proposed experimental method is based on the measurement of the tip-sample force via the detection of the second harmonic component of the photosensor ...
Schwartz, Gustavo Ariel, Riedel, Clément, Arinero, Richard, Tordjeman, Philippe, Alegría, Angel, Colmenero, Juan   +5 more
openaire   +5 more sources

Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques [PDF]

Омский научный вестник, 2018
Based on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined.
D. V. Sokolov, N. A. Davletkildeev, I. A. Lobov   +2 more
doaj   +1 more source

Scanning Probe Spectroscopy of WS₂/Graphene Van Der Waals Heterostructures

Nanomaterials, 2020
In this paper, we present a study of tungsten disulfide (WS2) two-dimensional (2D) crystals, grown on epitaxial Graphene. In particular, we have employed scanning electron microscopy (SEM) and µRaman spectroscopy combined with multifunctional scanning ...
Franco Dinelli, Filippo Fabbri, Stiven Forti, Camilla Coletti, Oleg V. Kolosov, Pasqualantonio Pingue   +5 more
doaj   +1 more source

Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications

Applied Microscopy, 2021
Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand
Young-Min Kim, Jihye Lee, Deok-Jin Jeon, Si-Eun Oh, Jong-Souk Yeo   +4 more
doaj   +1 more source

The detection of buried nanopillar based on electrostatic force microscopy simulation

AIP Advances, 2022
Based on electrostatic force microscopy (EFM), the image of nano-objects buried below the surface was numerically simulated by using COMSOL Multiphysics® software.
Yongzhen Luo, Guocong Lin, Xidong Ding, Tao Su   +3 more
doaj   +1 more source

Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy [PDF]

, 2010
We have developed a method for imaging the temperature-frequency dependence of the dynamics of nanostructured polymer films with spatial resolution. This method provides images with dielectric compositional contrast well decoupled from topography.
de Knijff, P., Duijm, E., Gravendeel, B., J., K., Mol, D., Raes, N., Reumer, J., van der Gaag,, van der Plicht, J., van Geel, B., van Leeuwen, J., Welker, F.   +11 more
core   +6 more sources

3D Nanoprinting of All-Metal Nanoprobes for Electric AFM Modes

Nanomaterials, 2022
3D nanoprinting via focused electron beam induced deposition (FEBID) is applied for fabrication of all-metal nanoprobes for atomic force microscopy (AFM)-based electrical operation modes. The 3D tip concept is based on a hollow-cone (HC) design, with all-
Lukas Matthias Seewald, Jürgen Sattelkow, Michele Brugger-Hatzl, Gerald Kothleitner, Hajo Frerichs, Christian Schwalb, Stefan Hummel, Harald Plank   +7 more
doaj   +1 more source