Results 11 to 20 of about 2,962,395 (163)
Charge Characterization Of An Electrically Charged Fiber Via Electrostatic Force Microscopy [PDF]
Journal of Engineered Fibers and Fabrics, 2006 The charge of a corona charged electret fiber as well as an uncharged glass fiber was characterized via Electrostatic Force Microscopy (EFM). Electrostatic force gradient images were obtained by monitoring the shifts in phase between the oscillations of ...
Juan P. Hinestroza +2 more
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Beilstein Journal of Nanotechnology, 2019 Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems.
Aaron Mascaro +4 more
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Electrostatic Force Microscopy Measurement System for Micro-topography of Non-conductive Devices
Measurement Science Review, 2018 A home-made electrostatic force microscopy (EFM) system is described which is directed toward assessment of the microscopic geometry of the surface of specimens made of non-conductive material with a large thickness. This system is based on the variation
He Gaofa +3 more
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Physics-Guided Multi-Channel Restoration for Efficient and Accurate Atomic Force Microscopy Imaging. [PDF]
Adv Sci (Weinh)Schematic figure of restoring noisy atomic force micrscopy (AFM) image via physics‐guided multi‐channel restoration. The lighter neural network models with multiple‐channel input from auxiliary signals outperforms heavier model with single‐channel input.
Sung J +13 more
europepmc +2 more sources
Scalable Fabrication of MOF Glass Membranes for Gas Separation via Stepwise Phase Transition. [PDF]
Adv Sci (Weinh)Metal‐organic framework (MOF) glass membranes, with their excellent processability and permanent pore structure, have great potential for gas separation applications. However, during large‐scale fabrication, defects and obvious cracks are prone to occur due to the limitations of powder processing.
Ye M +14 more
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AIP Advances, 2020 We use a new method based on Electrostatic Force Microscopy (EFM) to perform quantitative measurements of the dielectric constants of individual carboxylated as well as non-functionalized polystyrene nanospheres. The EFM data record the oscillation phase
Marc Descoteaux +2 more
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Electrostatic tip-dielectric sample interaction in electrostatic force microscopy
Revista Facultad de Ingeniería Universidad de Antioquia, 2013 Electric force microscopy is a local technique for measuring electrical properties of materials. The electrostatic force gradient measurements on dielectric samples are sensitive not only to the initial charge distribution in the sample but also to the ...
Ariel Gómez +2 more
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Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications [PDF]
Modern Electronic Materials, 2018 In this paper, we report the charge trapping phenomena in zinc oxide (n-ZnO) and Bi0.7Dy0.3FeO3 (BDFO)/ZnO thin films deposited on p-type <100> conducting Si substrate.
Deepak Bhatia +4 more
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Photoelectrical Properties Investigated on Individual Si Nanowires and Their Size Dependence
Nanoscale Research Letters, 2021 Periodically ordered arrays of vertically aligned Si nanowires (Si NWs) are successfully fabricated with controllable diameters and lengths. Their photoconductive properties are investigated by photoconductive atomic force microscopy (PCAFM) on ...
Xiaofeng Hu +3 more
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Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
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